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- 2003
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Mark
EXAFS measurements of metal-decorated nanocavities in Si
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Structure of amorphous silicon investigated by EXAFS
2003) In Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms 199. p.195-199(
- Contribution to journal › Article