Chris Glover (Former)
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- 2005
-
Mark
Bulk and surface charge states of K3C60
(
- Contribution to journal › Article
- 2004
-
Mark
Insulating surface layer on single crystal K3C60
(
- Contribution to journal › Article
- 2003
-
Mark
Excited-state charge transfer dynamics in systems of aromatic adsorbates on TiO2 studied with resonant core techniques
(
- Contribution to journal › Article
-
Mark
Direct observation of structural relaxation in amorphous compound semiconductors
2003) In Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms 206. p.1024-1027(
- Contribution to journal › Article
-
Mark
Structure of amorphous silicon investigated by EXAFS
2003) In Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms 199. p.195-199(
- Contribution to journal › Article
-
Mark
Direct evidence of defect annihilation during structural relaxation of amorphous indium phosphide
(
- Contribution to journal › Article
-
Mark
Common structure in amorphised compound semiconductors
2003) In Nuclear Instruments & Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms 199. p.235-239(
- Contribution to journal › Article
-
Mark
EXAFS measurements of metal-decorated nanocavities in Si
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2002
-
Mark
Structural characterization of amorphised InAs with synchrotron radiation
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding