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- 2003
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Mark
SOC Test Time Minimization Under Multiple Constraints
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Buffer and Controller Minimization for Time-Constrained Testing of System-On-Chip
2003) 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems DFT03 p.385-392(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Optimal System-on-Chip Test Scheduling
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
A Reconfigurable Power-conscious Core Wrapper and its Application to SOC Test Scheduling
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding