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- 2014
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Mark
Fault injection and fault handling: an MPSoC demonstrator using IEEE P1687
2014) 20th IEEE International On-Line Testing Symposium(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2008
-
Mark
Core-Level Expansion of Compressed Test Patterns
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Test-Architecture Optimization and Test Scheduling for SOCs with Core-Level Expansion of Compressed Test Patterns
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
An Architecture for Integrated Test Data Compression and Abort-on-Fail Testing in a Multi-Site Environment
(
- Contribution to journal › Article
-
Mark
An Integrated System-on-Chip Test Framework
2008) p.439-454(
- Chapter in Book/Report/Conference proceeding › Book chapter
-
Mark
SOC Test Optimization with Compression-Technique Selection
2008) A Workshop in Conjunction with the International Test Conference(
- Contribution to conference › Paper, not in proceeding
-
Mark
On Reduction of Capture Power for Modular System-on-Chip Test
2008) IEEE Workshop on RTL and High Level Testing WRTLT08(
- Contribution to conference › Paper, not in proceeding
- 2007
-
Mark
Protocol Requirements in an SJTAG/IJTAG Environment
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Test Data Truncation for Test Quality Maximization under ATE Memory Depth Constraint
(
- Contribution to journal › Article
-
Mark
Extended STAPL as SJTAG Engine
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding