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2025
Mark Evaluation of 3D-printed plastics for Ultra-High Vacuum applications : Outgassing, and residual gas analysis
Domingues, Artur ^LU ; Martínez-Carboneres, Ana ^LU and Carlson, Stefan ^LU (2025) In Vacuum 233.
- Contribution to journal › Article
Mark Field-hybridization acoustic tweezers
Wang, Qing ^LU ; Chen, Shuhan ; Zhou, Jia and Riaud, Antoine (2025) In Physical Review Applied 23(1).
- Contribution to journal › Article
Mark Methods for the Investigation and Mitigation of Conducted Differential-Mode Electromagnetic Interference in Commercial Electrical Vehicles
Widek, Per ^LU and Alaküla, Mats ^LU (2025) In Energies 18(4).
- Contribution to journal › Article
Mark Wideband single-layer D-band patch antenna with parasitic elements and superstrate loading
Cao, Yu-Yan ^LU ; Aliakbari Abar, Hanieh ^LU ; Aghdam, Parisa and Lau, Buon Kiong ^LU (2025)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Flammable and Toxic Gases from Batteries in Thermal Runaway: Consequences and mitigation
Nilsson, Elna J. K. ^LU ; Sahlberg, Anna-Lena ^LU ; Wilkens Flecknoe-Brown, Konrad ^LU and Runefors, Marcus ^LU (2025)
- Book/Report › Report
Mark Securing reconfigurable scan networks against data sniffing and data alteration attacks
Åhlund, Joel ^LU ; Törmänen, Markus ^LU ; Svensson, Pamela ; Kerttu, Mikael ; Månefjord, Torbjörn ; Johansson, Christian and Larsson, Erik ^LU (2025) 30th IEEE European Test Symposium
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark AC-DC Cuk Converter: A State-of-the-Art topological review
Ahmed, Istiak ; Alvy, Asif Imties ; Rahman, Irfan ; Al Hossain, Md. Abdullah ; Rahman, Showrov ; Al-Hysam, Abdullah ^LU and Razzak, Abdur (2025) In Energy Conversion and Management: X 27(July 2025).
- Contribution to journal › Scientific review
Mark Gate Layout and Process Reliability Co-Optimization in High-Speed Vertical III–V Nanowire Metal-Oxide-Semiconductor Field-Effect Transistor Technology
Sandberg, Marcus E. ^LU ; Löfstrand, Anette ^LU ; Svensson, Johannes ^LU and Fhager, Lars ^LU (2025) In Physica Status Solidi (A) Applications and Materials Science
- Contribution to journal › Article
Mark Memory State Dynamics in BEOL FeFETs : Impact of Area Ratio on Analog Write Mechanisms and Charging
Dahlberg, Hannes ^LU ; Kaatranen, Oscar ; Persson, Karl Magnus ^LU ; Rantala, Arto ; Flak, Jacek and Wernersson, Lars Erik ^LU (2025) In IEEE Access 13. p.9923-9930
- Contribution to journal › Article
Mark Large Language Models for Printed Circuit Board Test Generation
Lidbäck, Albin and Larsson, Erik ^LU (2025) 26th IEEE Latin-American Test Symposium (LATS2025)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding

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