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- 2017
-
Mark
BASTION: Board and SoC test instrumentation for ageing and no failure found
2017) In Proceedings (Design, Automation, and Test in Europe Conference and Exhibition. Online) p.115-120(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2015
-
Mark
No Fault Found: The Root Cause
2015) IEEE VLSI Test Symposium(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding