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- 2006
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Mark
Determination of interstitial oxygen concentration in germanium by infrared absorption
(
- Contribution to journal › Article
- 2002
-
Mark
Defect engineering in Czochralski silicon by electron irradiation at different temperatures
2002) E-MRS 2001 Spring Meeting Symposium B Defect Engineering of Advanced Semiconductor Devices 186(1). p.121-125(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Interstitial carbon-oxygen center and hydrogen related shallow thermal donors in Si
(
- Contribution to journal › Article