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- 2013
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Mark
Photodiodes in Deep Submicron CMOS Process for Fully Integrated Optical Receivers
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Characterization of Border Traps in III-V MOSFETs Using an RF Transconductance Method
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding