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- 2017
-
Mark
BASTION: Board and SoC test instrumentation for ageing and no failure found
2017) In Proceedings (Design, Automation, and Test in Europe Conference and Exhibition. Online) p.115-120(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2016
-
Mark
Retargeting Challenges in IEEE 1687 Networks
2016) Test Standards Application Workshop (TESTA)(
- Contribution to conference › Paper, not in proceeding
-
Mark
Test, Validation and Diagnosis of IEEE 1687 Networks
2016) Test Standards Application Workshop (TESTA)(
- Contribution to conference › Paper, not in proceeding
-
Mark
Towards a Suite of IEEE 1687 Benchmark Networks
2016) Test Standards Application Workshop (TESTA)(
- Contribution to conference › Paper, not in proceeding
- 2015
-
Mark
No Fault Found: The Root Cause
2015) IEEE VLSI Test Symposium(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2014
-
Mark
Design, Verification and Application of IEEE 1687
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2012
-
Mark
Re-using Chip Level DFT at Board Level
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2011
-
Mark
SoC-Level Fault Management based on P1687 IJTAG
2011)(
- Other contribution › Miscellaneous