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- 2021
-
Mark
Graceful Degradation of Reconfigurable Scan Networks
(
- Contribution to journal › Scientific review
-
Mark
Accessing general IEEE Std. 1687 networks via functional ports
2021) p.354-363(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
System-Level Access to On-Chip Instruments
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2020
-
Mark
IEEE Std. P1687.1 for Access Control of Reconfigurable Scan Networks
2020) 25th IEEE European Test Symposium (ETS), 2020(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2019
-
Mark
IEEE Std. P1687.1: translator and protocol
2019) International Test Conference (ITC)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
IEEE Std. P1687.1: Access to IEEE Std. 1687 via UART
2019) 4th International Test Standards Application Workshop(
- Contribution to conference › Paper, not in proceeding