Re-using Chip Level DFT at Board Level
(2012) European Test Symposium, 2012 p.205-205- Abstract
- As chips are getting increasingly complex, there is no surprise to find more and more built-in DFX. This built-in DFT is obviously beneficial for chip/silicon DFX engineers; however, board/system level DFX engineers often have limited access to the build in DFX features. There is currently an increasing demand from board/system level DFX engineers to reuse chip/silicon DFX at board/system level. This special session will discuss: What chip access is needed for board-level for test and diagnosis? How to accomplish the access? Will IEEE P1687 and IEEE 1149.1 solve these problems?
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2732595
- author
- Gu, Xinli ; Rearick, Jeff ; Eklow, Bill ; Qian, Jun ; Jutman, Artur ; Chakrabarty, Krishnendu and Larsson, Erik LU
- organization
- publishing date
- 2012
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- keywords
- Board test, board diagnosis, chip access, IEEE P1687, IEEE 1149.1
- host publication
- [Host publication title missing]
- pages
- 1 pages
- publisher
- IEEE - Institute of Electrical and Electronics Engineers Inc.
- conference name
- European Test Symposium, 2012
- conference location
- Annecy, France
- conference dates
- 2012-05-28 - 2012-05-28
- external identifiers
-
- scopus:84864714878
- language
- English
- LU publication?
- yes
- id
- 0058eb93-f749-4b1e-890c-7e32ca96a97f (old id 2732595)
- date added to LUP
- 2016-04-04 12:02:04
- date last changed
- 2022-01-29 22:47:16
@inproceedings{0058eb93-f749-4b1e-890c-7e32ca96a97f, abstract = {{As chips are getting increasingly complex, there is no surprise to find more and more built-in DFX. This built-in DFT is obviously beneficial for chip/silicon DFX engineers; however, board/system level DFX engineers often have limited access to the build in DFX features. There is currently an increasing demand from board/system level DFX engineers to reuse chip/silicon DFX at board/system level. This special session will discuss: What chip access is needed for board-level for test and diagnosis? How to accomplish the access? Will IEEE P1687 and IEEE 1149.1 solve these problems?}}, author = {{Gu, Xinli and Rearick, Jeff and Eklow, Bill and Qian, Jun and Jutman, Artur and Chakrabarty, Krishnendu and Larsson, Erik}}, booktitle = {{[Host publication title missing]}}, keywords = {{Board test; board diagnosis; chip access; IEEE P1687; IEEE 1149.1}}, language = {{eng}}, pages = {{205--205}}, publisher = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}}, title = {{Re-using Chip Level DFT at Board Level}}, url = {{https://lup.lub.lu.se/search/files/5911952/2732605.pdf}}, year = {{2012}}, }