Accessing Embedded DfT Instruments with IEEE P1687
Larsson, Erik LU
and Ghani Zadegan, Farrokh
LU
(2012)
IEEE 21st Asian Test Symposium (ATS)
p.71-76
- Abstract
- While the advancement in semiconductor technologies enables manufacturing of highly advanced and complex integrated circuits, there is an increasing need of embedded (on-chip) instruments for test, debug, diagnosis, configuration, monitoring, etc. A key challenge is how to access these instruments from chip terminals in a low-cost, non-intrusive, standardized, flexible and scalable manner. The well-adopted IEEE 1149.1 (Joint Test Action Group (JTAG)) standard offers low-cost, non- intrusive and standardized access but lacks flexibility and scalability, which is addressed by the on-going IEEE P1687 (Internal JTAG (IJTAG)) standardization initiative. This paper discusses the need of embedded instrumentation, the shortcomings of IEEE 1149.1... (More)
- While the advancement in semiconductor technologies enables manufacturing of highly advanced and complex integrated circuits, there is an increasing need of embedded (on-chip) instruments for test, debug, diagnosis, configuration, monitoring, etc. A key challenge is how to access these instruments from chip terminals in a low-cost, non-intrusive, standardized, flexible and scalable manner. The well-adopted IEEE 1149.1 (Joint Test Action Group (JTAG)) standard offers low-cost, non- intrusive and standardized access but lacks flexibility and scalability, which is addressed by the on-going IEEE P1687 (Internal JTAG (IJTAG)) standardization initiative. This paper discusses the need of embedded instrumentation, the shortcomings of IEEE 1149.1 as well as features and challenges of IEEE P1687. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/3173262
- author
- Larsson, Erik
LU
and Ghani Zadegan, Farrokh
LU
- organization
- publishing date
- 2012
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- keywords
- IEEE P1687 IJTAG, IEEE 1149.1, embedded instruments
- host publication
- IEEE 21st Asian Test Symposium (ATS), 2012
- pages
- 71 - 76
- publisher
- IEEE - Institute of Electrical and Electronics Engineers Inc.
- conference name
- IEEE 21st Asian Test Symposium (ATS)
- conference location
- Niigata, Japan
- conference dates
- 2012-11-20
- external identifiers
-
- scopus:84872510082
- ISSN
- 1081-7735
- ISBN
- 978-1-4673-4555-2
- DOI
- 10.1109/ATS.2012.74
- language
- English
- LU publication?
- yes
- id
- 03076f42-6364-48e3-97b3-2a19b474b769 (old id 3173262)
- date added to LUP
- 2016-04-01 13:33:31
- date last changed
- 2022-02-04 08:08:51
@inproceedings{03076f42-6364-48e3-97b3-2a19b474b769,
abstract = {{While the advancement in semiconductor technologies enables manufacturing of highly advanced and complex integrated circuits, there is an increasing need of embedded (on-chip) instruments for test, debug, diagnosis, configuration, monitoring, etc. A key challenge is how to access these instruments from chip terminals in a low-cost, non-intrusive, standardized, flexible and scalable manner. The well-adopted IEEE 1149.1 (Joint Test Action Group (JTAG)) standard offers low-cost, non- intrusive and standardized access but lacks flexibility and scalability, which is addressed by the on-going IEEE P1687 (Internal JTAG (IJTAG)) standardization initiative. This paper discusses the need of embedded instrumentation, the shortcomings of IEEE 1149.1 as well as features and challenges of IEEE P1687.}},
author = {{Larsson, Erik and Ghani Zadegan, Farrokh}},
booktitle = {{IEEE 21st Asian Test Symposium (ATS), 2012}},
isbn = {{978-1-4673-4555-2}},
issn = {{1081-7735}},
keywords = {{IEEE P1687 IJTAG; IEEE 1149.1; embedded instruments}},
language = {{eng}},
pages = {{71--76}},
publisher = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
title = {{Accessing Embedded DfT Instruments with IEEE P1687}},
url = {{https://lup.lub.lu.se/search/files/3446161/3173263.pdf}},
doi = {{10.1109/ATS.2012.74}},
year = {{2012}},
}