New Flexible Toolbox for Nanomechanical Measurements with Extreme Precision and at Very High Frequencies.
(2010) In Nano Letters 10(Online August 26, 2010). p.3893-3898- Abstract
- We show that the principally two-dimensional (2D) scanning tunneling microscope (STM) can be used for imaging of 1D micrometer high free-standing nanowires. We can then determine nanowire megahertz resonance frequencies, image their top-view 2D resonance shapes, and investigate axial stress on the nanoscale. Importantly, we demonstrate the extreme sensitivity of electron tunneling even at very high frequencies by measuring resonances at hundreds of megahertz with a precision far below the angstrom scale.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/1664998
- author
- Fian, Alexander ; Lexholm, Monica LU ; Timm, Rainer LU ; Mandl, Bernhard LU ; Håkanson, Ulf LU ; Hessman, Dan LU ; Lundgren, Edvin LU ; Samuelson, Lars LU and Mikkelsen, Anders LU
- organization
- publishing date
- 2010
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Nano Letters
- volume
- 10
- issue
- Online August 26, 2010
- pages
- 3893 - 3898
- publisher
- The American Chemical Society (ACS)
- external identifiers
-
- wos:000282727600015
- pmid:20795707
- scopus:77958027591
- pmid:20795707
- ISSN
- 1530-6992
- DOI
- 10.1021/nl1015427
- language
- English
- LU publication?
- yes
- id
- fc690efc-4224-4e01-b21c-b7695d024496 (old id 1664998)
- date added to LUP
- 2016-04-01 13:58:40
- date last changed
- 2023-09-17 07:54:35
@article{fc690efc-4224-4e01-b21c-b7695d024496, abstract = {{We show that the principally two-dimensional (2D) scanning tunneling microscope (STM) can be used for imaging of 1D micrometer high free-standing nanowires. We can then determine nanowire megahertz resonance frequencies, image their top-view 2D resonance shapes, and investigate axial stress on the nanoscale. Importantly, we demonstrate the extreme sensitivity of electron tunneling even at very high frequencies by measuring resonances at hundreds of megahertz with a precision far below the angstrom scale.}}, author = {{Fian, Alexander and Lexholm, Monica and Timm, Rainer and Mandl, Bernhard and Håkanson, Ulf and Hessman, Dan and Lundgren, Edvin and Samuelson, Lars and Mikkelsen, Anders}}, issn = {{1530-6992}}, language = {{eng}}, number = {{Online August 26, 2010}}, pages = {{3893--3898}}, publisher = {{The American Chemical Society (ACS)}}, series = {{Nano Letters}}, title = {{New Flexible Toolbox for Nanomechanical Measurements with Extreme Precision and at Very High Frequencies.}}, url = {{http://dx.doi.org/10.1021/nl1015427}}, doi = {{10.1021/nl1015427}}, volume = {{10}}, year = {{2010}}, }