Erik Larsson
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- 2009
-
Mark
Power Efficient Redundant Execution for Chip Multiprocessors
Subramanyan, Pramod ; Singh, Virendra ; Saluja, Kewal K. and Larsson, Erik LU
(2009)
Workshop on Dependable and Secure Nanocomputing
p.1-6
- Contribution to conference › Paper, not in proceeding
-
Mark
Generation of Minimal Leakage Input Vectors with Constrained NBTI Degradation
Subramanyan, Pramod ; Jangir, Ram Rakesh ; Tudu, Jaynarayan T. ; Larsson, Erik LU
and Singh, Virendra
(2009)
7th IEEE East-West Design and Test Symposium (EWDTS)
p.1-4
- Contribution to conference › Paper, not in proceeding
-
Mark
On Scan Chain Diagnosis for Intermittent Faults
Adolfsson, Dan ; Siew, Joanna ; Marinissen, Erik Jan and Larsson, Erik LU
(2009)
IEEE Asian Test Symposium (ATS)
p.47-54
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Capture Power Reduction for Modular System-on-Chip Test
Tudu, Jaynarayan T. ; Larsson, Erik LU
; Singh, Virendra
and Singh, Adit
(2009)
IEEE/VSI VLSI Design and Test Symposium (VDAT)
- Contribution to conference › Paper, not in proceeding
- 2008
-
Mark
Cycle-Accurate Test Power Modeling and its Application to SoC Test Architecture Design and Scheduling
Samii, Soheil ; Selkälä, Mikko ; Larsson, Erik LU
; Chakrabarty, Krishnendu
and Peng, Zebo
(2008)
In IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
27(5).
p.973-977
- Contribution to journal › Article
-
Mark
An Architecture for Integrated Test Data Compression and Abort-on-Fail Testing in a Multi-Site Environment
- Contribution to journal › Article
-
Mark
A reconfigurable power conscious core wrapper and its application to system-on-chip test scheduling
- Contribution to journal › Article
-
Mark
Core-Level Expansion of Compressed Test Patterns
Larsson, Anders ; Zhang, Xin ; Larsson, Erik LU
and Chakrabarty, Krishnendu
(2008)
17th Asian Test Symposium ATS
p.277-277
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
SOC Test Optimization with Compression-Technique Selection
Larsson, Anders ; Zhang, Xin ; Larsson, Erik LU
and Chakrabarty, Krishnendu
(2008)
A Workshop in Conjunction with the International Test Conference
- Contribution to conference › Paper, not in proceeding
-
Mark
On Reduction of Capture Power for Modular System-on-Chip Test
- Contribution to conference › Paper, not in proceeding