Jonas Tegenfeldt

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1995
Mark A Nanosensor for Admittance Spectroscopy
Tegenfeldt, Jonas ^LU ; Montelius, Lars ^LU and Ling, Tornbjörn G. I. (1995) p.115-122
- Chapter in Book/Report/Conference proceeding › Book chapter
1994
Mark Direct observation of the atomic force microscopy tip using inverse atomic force microscopy imaging
Montelius, L. ^LU ; Tegenfeldt, Jonas ^LU and van Heeren, P (1994) In Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures 12(3). p.2222-2226
- Contribution to journal › Article
1993
Mark Direct observation of the tip shape in scanning probe microscopy
Montelius, L. ^LU and Tegenfeldt, J. O. ^LU (1993) In Applied Physics Letters 62(21). p.2628-2630
- Contribution to journal › Article

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