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On the Edge : In situ Kelvin probe AFM on InP nanowire arrays

Irish, Austin LU ; Hrachowina, Lukas LU ; Alcer, David LU orcid ; Borgström, Magnus LU orcid and Timm, Rainer LU orcid (2026) In Ultramicroscopy 281.
Abstract

Surface physics play an outsized role in nanostructured electronic devices such as solar cells. Semiconductor nanowires are perfect candidates for advanced solar cells due to their outstanding light absorption properties and their flexibility in axially stacking materials of different doping and band gap. Due to nanowire geometry, however, their surfaces dominate device performance and at the same time are challenging to investigate. Kelvin probe force microscopy (KPFM), an atomic force microscopy (AFM)-based method, provides a unique structural and electrical characterization even in unconventional 3D geometries. We demonstrate a high-resolution, non-destructive AFM technique for directly measuring nanowires within an array and still... (More)

Surface physics play an outsized role in nanostructured electronic devices such as solar cells. Semiconductor nanowires are perfect candidates for advanced solar cells due to their outstanding light absorption properties and their flexibility in axially stacking materials of different doping and band gap. Due to nanowire geometry, however, their surfaces dominate device performance and at the same time are challenging to investigate. Kelvin probe force microscopy (KPFM), an atomic force microscopy (AFM)-based method, provides a unique structural and electrical characterization even in unconventional 3D geometries. We demonstrate a high-resolution, non-destructive AFM technique for directly measuring nanowires within an array and still on their growth substrate. This in situ approach ensures measurement integrity and relevance while preserving the structures for subsequent measurement and processing. When compared with electron beam-induced current, cross-sectional KPFM is both more surface sensitive and less destructive. Utilizing such a cross-sectional approach facilitates rapid and comprehensive characterization of nanoelectronic surfaces.

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author
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organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
Afm, Atomic force microscopy, Kelvin probe force microscopy, Kpfm, Nanowire, Photovoltaic, Surface potential
in
Ultramicroscopy
volume
281
article number
114284
publisher
Elsevier
external identifiers
  • pmid:41344225
  • scopus:105023656581
ISSN
0304-3991
DOI
10.1016/j.ultramic.2025.114284
language
English
LU publication?
yes
additional info
Publisher Copyright: © 2025
id
0de7a2da-d933-4f03-8f23-a3b44dbb91d1
date added to LUP
2026-01-12 14:54:41
date last changed
2026-01-13 14:04:03
@article{0de7a2da-d933-4f03-8f23-a3b44dbb91d1,
  abstract     = {{<p>Surface physics play an outsized role in nanostructured electronic devices such as solar cells. Semiconductor nanowires are perfect candidates for advanced solar cells due to their outstanding light absorption properties and their flexibility in axially stacking materials of different doping and band gap. Due to nanowire geometry, however, their surfaces dominate device performance and at the same time are challenging to investigate. Kelvin probe force microscopy (KPFM), an atomic force microscopy (AFM)-based method, provides a unique structural and electrical characterization even in unconventional 3D geometries. We demonstrate a high-resolution, non-destructive AFM technique for directly measuring nanowires within an array and still on their growth substrate. This in situ approach ensures measurement integrity and relevance while preserving the structures for subsequent measurement and processing. When compared with electron beam-induced current, cross-sectional KPFM is both more surface sensitive and less destructive. Utilizing such a cross-sectional approach facilitates rapid and comprehensive characterization of nanoelectronic surfaces.</p>}},
  author       = {{Irish, Austin and Hrachowina, Lukas and Alcer, David and Borgström, Magnus and Timm, Rainer}},
  issn         = {{0304-3991}},
  keywords     = {{Afm; Atomic force microscopy; Kelvin probe force microscopy; Kpfm; Nanowire; Photovoltaic; Surface potential}},
  language     = {{eng}},
  publisher    = {{Elsevier}},
  series       = {{Ultramicroscopy}},
  title        = {{On the Edge : In situ Kelvin probe AFM on InP nanowire arrays}},
  url          = {{http://dx.doi.org/10.1016/j.ultramic.2025.114284}},
  doi          = {{10.1016/j.ultramic.2025.114284}},
  volume       = {{281}},
  year         = {{2026}},
}