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Reduced impact of induced gate noise on inductively degenerated LNAs in deep submicron CMOS technologies

Rossi, Paolo; Svelto, Francesco; Mazzanti, Andrea and Andreani, Pietro LU (2005) In Analog Integrated Circuits and Signal Processing 42(1). p.31-36
Abstract
Designers of radio-frequency inductively-degenerated CMOS low-noise-amplifiers have usually not followed the guidelines for achieving minimum noise figure. Nonetheless, state-of-the- art implementations display noise figure values very close to the theoretical minimum. In this paper, we point out that this is due to the effect of the parasitic overlap capacitances in the MOS device. In particular, we show that overlap capacitances lead to a significant induced-gate-noise reduction, especially when deep sub-micron CMOS processes are used.
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author
publishing date
type
Contribution to journal
publication status
published
subject
in
Analog Integrated Circuits and Signal Processing
volume
42
issue
1
pages
31 - 36
publisher
Springer
external identifiers
  • scopus:4544260888
ISSN
0925-1030
DOI
10.1007/s10470-004-6845-z
language
English
LU publication?
no
id
9c65a1c1-b016-4ed4-afc6-9196ffc3b77c (old id 1051582)
alternative location
http://www.springerlink.com/content/fw01u3vva128aeg8/fulltext.pdf
date added to LUP
2008-04-03 13:13:04
date last changed
2017-01-01 07:43:58
@article{9c65a1c1-b016-4ed4-afc6-9196ffc3b77c,
  abstract     = {Designers of radio-frequency inductively-degenerated CMOS low-noise-amplifiers have usually not followed the guidelines for achieving minimum noise figure. Nonetheless, state-of-the- art implementations display noise figure values very close to the theoretical minimum. In this paper, we point out that this is due to the effect of the parasitic overlap capacitances in the MOS device. In particular, we show that overlap capacitances lead to a significant induced-gate-noise reduction, especially when deep sub-micron CMOS processes are used.},
  author       = {Rossi, Paolo and Svelto, Francesco and Mazzanti, Andrea and Andreani, Pietro},
  issn         = {0925-1030},
  language     = {eng},
  number       = {1},
  pages        = {31--36},
  publisher    = {Springer},
  series       = {Analog Integrated Circuits and Signal Processing},
  title        = {Reduced impact of induced gate noise on inductively degenerated LNAs in deep submicron CMOS technologies},
  url          = {http://dx.doi.org/10.1007/s10470-004-6845-z},
  volume       = {42},
  year         = {2005},
}