Probing of individual semiconductor nanowhiskers by TEM-STM
(2004) In Microscopy and Microanalysis 10(1). p.41-46- Abstract
- Along with rapidly developing nanotechnology, new types of analytical instruments and techniques are needed. Here we report an alternative procedure for electrical measurements on semiconductor nanowhiskers, allowing precise selection and visual control at close to atomic resolution. We use a combination of two powerful microscope techniques, scanning tunneling microscopy (STM) and simultaneous viewing in a transmission electron microscope (TEM). The STM is mounted in the sample holder for the TEM. We describe here a method for creating an ohmic contact between the STM tip and the nanowhisker. We examine three different types of STM tips and present a technique for cleaning the STM tip in situ. Measurements on 1-mum-tall and 40-nm-thick... (More)
- Along with rapidly developing nanotechnology, new types of analytical instruments and techniques are needed. Here we report an alternative procedure for electrical measurements on semiconductor nanowhiskers, allowing precise selection and visual control at close to atomic resolution. We use a combination of two powerful microscope techniques, scanning tunneling microscopy (STM) and simultaneous viewing in a transmission electron microscope (TEM). The STM is mounted in the sample holder for the TEM. We describe here a method for creating an ohmic contact between the STM tip and the nanowhisker. We examine three different types of STM tips and present a technique for cleaning the STM tip in situ. Measurements on 1-mum-tall and 40-nm-thick epitaxially grown InAs nanowhiskers show an ohmic contact and a resistance of down to 7 kOmega. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/140955
- author
- Larsson, Magnus LU ; Wallenberg, Reine LU ; Persson, Ann LU and Samuelson, Lars LU
- organization
- publishing date
- 2004
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Microscopy and Microanalysis
- volume
- 10
- issue
- 1
- pages
- 41 - 46
- publisher
- Cambridge University Press
- external identifiers
-
- wos:000188882100008
- pmid:15306066
- scopus:1442289770
- ISSN
- 1435-8115
- DOI
- 10.1017/S1431927604040176
- language
- English
- LU publication?
- yes
- additional info
- The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Solid State Physics (011013006), Polymer and Materials Chemistry (LTH) (011001041)
- id
- d80a0464-91f8-43d0-a004-4d6ab087aea3 (old id 140955)
- date added to LUP
- 2016-04-01 12:06:00
- date last changed
- 2022-04-13 06:05:20
@article{d80a0464-91f8-43d0-a004-4d6ab087aea3, abstract = {{Along with rapidly developing nanotechnology, new types of analytical instruments and techniques are needed. Here we report an alternative procedure for electrical measurements on semiconductor nanowhiskers, allowing precise selection and visual control at close to atomic resolution. We use a combination of two powerful microscope techniques, scanning tunneling microscopy (STM) and simultaneous viewing in a transmission electron microscope (TEM). The STM is mounted in the sample holder for the TEM. We describe here a method for creating an ohmic contact between the STM tip and the nanowhisker. We examine three different types of STM tips and present a technique for cleaning the STM tip in situ. Measurements on 1-mum-tall and 40-nm-thick epitaxially grown InAs nanowhiskers show an ohmic contact and a resistance of down to 7 kOmega.}}, author = {{Larsson, Magnus and Wallenberg, Reine and Persson, Ann and Samuelson, Lars}}, issn = {{1435-8115}}, language = {{eng}}, number = {{1}}, pages = {{41--46}}, publisher = {{Cambridge University Press}}, series = {{Microscopy and Microanalysis}}, title = {{Probing of individual semiconductor nanowhiskers by TEM-STM}}, url = {{https://lup.lub.lu.se/search/files/2781073/624776.pdf}}, doi = {{10.1017/S1431927604040176}}, volume = {{10}}, year = {{2004}}, }