Advanced

Probing of individual semiconductor nanowhiskers by TEM-STM

Larsson, Magnus LU ; Wallenberg, Reine LU ; Persson, Ann LU and Samuelson, Lars LU (2004) In Microscopy and Microanalysis 10(1). p.41-46
Abstract
Along with rapidly developing nanotechnology, new types of analytical instruments and techniques are needed. Here we report an alternative procedure for electrical measurements on semiconductor nanowhiskers, allowing precise selection and visual control at close to atomic resolution. We use a combination of two powerful microscope techniques, scanning tunneling microscopy (STM) and simultaneous viewing in a transmission electron microscope (TEM). The STM is mounted in the sample holder for the TEM. We describe here a method for creating an ohmic contact between the STM tip and the nanowhisker. We examine three different types of STM tips and present a technique for cleaning the STM tip in situ. Measurements on 1-mum-tall and 40-nm-thick... (More)
Along with rapidly developing nanotechnology, new types of analytical instruments and techniques are needed. Here we report an alternative procedure for electrical measurements on semiconductor nanowhiskers, allowing precise selection and visual control at close to atomic resolution. We use a combination of two powerful microscope techniques, scanning tunneling microscopy (STM) and simultaneous viewing in a transmission electron microscope (TEM). The STM is mounted in the sample holder for the TEM. We describe here a method for creating an ohmic contact between the STM tip and the nanowhisker. We examine three different types of STM tips and present a technique for cleaning the STM tip in situ. Measurements on 1-mum-tall and 40-nm-thick epitaxially grown InAs nanowhiskers show an ohmic contact and a resistance of down to 7 kOmega. (Less)
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Microscopy and Microanalysis
volume
10
issue
1
pages
41 - 46
publisher
Cambridge University Press
external identifiers
  • wos:000188882100008
  • pmid:15306066
  • scopus:1442289770
ISSN
1435-8115
DOI
10.1017/S1431927604040176
language
English
LU publication?
yes
id
d80a0464-91f8-43d0-a004-4d6ab087aea3 (old id 140955)
date added to LUP
2007-07-13 14:03:55
date last changed
2017-01-08 03:59:26
@article{d80a0464-91f8-43d0-a004-4d6ab087aea3,
  abstract     = {Along with rapidly developing nanotechnology, new types of analytical instruments and techniques are needed. Here we report an alternative procedure for electrical measurements on semiconductor nanowhiskers, allowing precise selection and visual control at close to atomic resolution. We use a combination of two powerful microscope techniques, scanning tunneling microscopy (STM) and simultaneous viewing in a transmission electron microscope (TEM). The STM is mounted in the sample holder for the TEM. We describe here a method for creating an ohmic contact between the STM tip and the nanowhisker. We examine three different types of STM tips and present a technique for cleaning the STM tip in situ. Measurements on 1-mum-tall and 40-nm-thick epitaxially grown InAs nanowhiskers show an ohmic contact and a resistance of down to 7 kOmega.},
  author       = {Larsson, Magnus and Wallenberg, Reine and Persson, Ann and Samuelson, Lars},
  issn         = {1435-8115},
  language     = {eng},
  number       = {1},
  pages        = {41--46},
  publisher    = {Cambridge University Press},
  series       = {Microscopy and Microanalysis},
  title        = {Probing of individual semiconductor nanowhiskers by TEM-STM},
  url          = {http://dx.doi.org/10.1017/S1431927604040176},
  volume       = {10},
  year         = {2004},
}