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<iframe src="https://lup.lub.lu.se/search/publication?embed=1&q=issn+exact+%221435-8115%22&amp;hide_pagination=1&amp;hide_info=1&amp;hide_options=1"
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2024
Mark Diffusion Bonding 321-Grade Stainless Steel : Failure and Multimodal Characterization
Lazar, Isac ^LU ; Knutsson, Axel ^LU ; Romero, Hector Pous ; Hektor, Johan ^LU ; Bushlya, Volodymyr ^LU ; Mikkelsen, Anders ^LU and Lenrick, Filip ^LU (2024) In Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 30(2). p.192-199
- Contribution to journal › Article
Mark Model-Fitting Weighted Least Squares as an alternative to Principal Component Analysis for Analyzing Energy-Dispersive X-ray Spectroscopy Spectrum Images
Wahlqvist, David ^LU and Ek, Martin ^LU (2024) In Microscopy and Microanalysis
- Contribution to journal › Article
2023
Mark Probing Catalyst Surfaces at the Atomic-scale
Ek, M. ^LU ; Hansen, L. P. ; Chen, F. R. ; van Dyck, D. ; Kisielowski, C. ; Specht, P. ; Damsgaard, C. D. ; Jinschek, J. R. and Helveg, S. (2023) In Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 29(1). p.1291-1291
- Contribution to journal › Letter
2014
Mark FIB Plan and Side View Cross-Sectional TEM Sample Preparation of Nanostructures.
Lenrick, Filip ^LU ; Ek, Martin ^LU ; Jacobsson, Daniel ^LU ; Borgström, Magnus ^LU and Wallenberg, Reine ^LU (2014) In Microscopy and Microanalysis 20(1). p.133-140
- Contribution to journal › Article
2011
Mark Electron Image Series Reconstruction of Twin Interfaces in InP Superlattice Nanowires.
Ek, Martin ^LU ; Borgström, Magnus ^LU ; Karlsson, Lisa ^LU ; Hetherington, Crispin ^LU and Wallenberg, Reine ^LU (2011) In Microscopy and Microanalysis 17(5). p.752-758
- Contribution to journal › Article
2007
Mark The Use of SIMS and SEM for the Characterization of Individual Particles with a Matrix Originating from a Nuclear Weapon.
Ranebo, Ylva ^LU ; Eriksson, Mats ; Tamborini, Gabriele ; Niagolova, Nedialka ; Bildstein, Olivier and Betti, Maria (2007) In Microscopy and Microanalysis 13(3). p.179-190
- Contribution to journal › Article
2006
Mark Imaging atomic structure in metal nanoparticles using high-resolution cryo-TEM
Balmes, Olivier ^LU ; Malm, Jan-Olle ^LU ; Pettersson, N ; Karlsson, Gunnel ^LU and Bovin, Jan-Olov ^LU (2006) In Microscopy and Microanalysis 12(2). p.145-150
- Contribution to journal › Article
2004
Mark Probing of individual semiconductor nanowhiskers by TEM-STM
Larsson, Magnus ^LU ; Wallenberg, Reine ^LU ; Persson, Ann ^LU and Samuelson, Lars ^LU (2004) In Microscopy and Microanalysis 10(1). p.41-46
- Contribution to journal › Article