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New Flexible Toolbox for Nanomechanical Measurements with Extreme Precision and at Very High Frequencies.

Fian, Alexander; Lexholm, Monica LU ; Timm, Rainer LU ; Mandl, Bernhard LU ; Håkanson, Ulf LU ; Hessman, Dan LU ; Lundgren, Edvin LU ; Samuelson, Lars LU and Mikkelsen, Anders LU (2010) In Nano Letters 10(Online August 26, 2010). p.3893-3898
Abstract
We show that the principally two-dimensional (2D) scanning tunneling microscope (STM) can be used for imaging of 1D micrometer high free-standing nanowires. We can then determine nanowire megahertz resonance frequencies, image their top-view 2D resonance shapes, and investigate axial stress on the nanoscale. Importantly, we demonstrate the extreme sensitivity of electron tunneling even at very high frequencies by measuring resonances at hundreds of megahertz with a precision far below the angstrom scale.
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Nano Letters
volume
10
issue
Online August 26, 2010
pages
3893 - 3898
publisher
The American Chemical Society
external identifiers
  • wos:000282727600015
  • pmid:20795707
  • scopus:77958027591
ISSN
1530-6992
DOI
10.1021/nl1015427
language
English
LU publication?
yes
id
fc690efc-4224-4e01-b21c-b7695d024496 (old id 1664998)
date added to LUP
2010-09-07 15:00:26
date last changed
2018-05-29 12:03:01
@article{fc690efc-4224-4e01-b21c-b7695d024496,
  abstract     = {We show that the principally two-dimensional (2D) scanning tunneling microscope (STM) can be used for imaging of 1D micrometer high free-standing nanowires. We can then determine nanowire megahertz resonance frequencies, image their top-view 2D resonance shapes, and investigate axial stress on the nanoscale. Importantly, we demonstrate the extreme sensitivity of electron tunneling even at very high frequencies by measuring resonances at hundreds of megahertz with a precision far below the angstrom scale.},
  author       = {Fian, Alexander and Lexholm, Monica and Timm, Rainer and Mandl, Bernhard and Håkanson, Ulf and Hessman, Dan and Lundgren, Edvin and Samuelson, Lars and Mikkelsen, Anders},
  issn         = {1530-6992},
  language     = {eng},
  number       = {Online August 26, 2010},
  pages        = {3893--3898},
  publisher    = {The American Chemical Society},
  series       = {Nano Letters},
  title        = {New Flexible Toolbox for Nanomechanical Measurements with Extreme Precision and at Very High Frequencies.},
  url          = {http://dx.doi.org/10.1021/nl1015427},
  volume       = {10},
  year         = {2010},
}