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Electron Image Series Reconstruction of Twin Interfaces in InP Superlattice Nanowires.

Ek, Martin LU ; Borgström, Magnus LU ; Karlsson, Lisa LU ; Hetherington, Crispin LU and Wallenberg, Reine LU (2011) In Microscopy and Microanalysis 17(5). p.752-758
Abstract
The twin interface structure in twinning superlattice InP nanowires with zincblende structure has been investigated using electron exit wavefunction restoration from focal series images recorded on an aberration-corrected transmission electron microscope. By comparing the exit wavefunction phase with simulations from model structures, it was possible to determine the twin structure to be the ortho type with preserved In-P bonding order across the interface. The bending of the thin nanowires away from the intended ⟨110⟩ axis could be estimated locally from the calculated diffraction pattern, and this parameter was successfully taken into account in the simulations.
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Microscopy and Microanalysis
volume
17
issue
5
pages
752 - 758
publisher
Cambridge University Press
external identifiers
  • wos:000295609100013
  • pmid:21899810
  • scopus:80054896161
ISSN
1435-8115
DOI
10.1017/S1431927611000493
language
English
LU publication?
yes
id
dc1697c0-4d50-4af2-9509-88d98afd69f3 (old id 2169070)
date added to LUP
2011-10-07 14:14:53
date last changed
2017-01-01 07:37:24
@article{dc1697c0-4d50-4af2-9509-88d98afd69f3,
  abstract     = {The twin interface structure in twinning superlattice InP nanowires with zincblende structure has been investigated using electron exit wavefunction restoration from focal series images recorded on an aberration-corrected transmission electron microscope. By comparing the exit wavefunction phase with simulations from model structures, it was possible to determine the twin structure to be the ortho type with preserved In-P bonding order across the interface. The bending of the thin nanowires away from the intended ⟨110⟩ axis could be estimated locally from the calculated diffraction pattern, and this parameter was successfully taken into account in the simulations.},
  author       = {Ek, Martin and Borgström, Magnus and Karlsson, Lisa and Hetherington, Crispin and Wallenberg, Reine},
  issn         = {1435-8115},
  language     = {eng},
  number       = {5},
  pages        = {752--758},
  publisher    = {Cambridge University Press},
  series       = {Microscopy and Microanalysis},
  title        = {Electron Image Series Reconstruction of Twin Interfaces in InP Superlattice Nanowires.},
  url          = {http://dx.doi.org/10.1017/S1431927611000493},
  volume       = {17},
  year         = {2011},
}