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Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints

Ghani Zadegan, Farrokh LU ; Ingelsson, Urban; Asani, Golnaz; Carlsson, Gunnar and Larsson, Erik LU (2011) Test Symposium (ATS), 2011 20th Asian In [Host publication title missing] p.525-531
Abstract
In contrast to IEEE 1149.1, IEEE P1687 allows, through segment insertion bits, flexible scan paths for accessing on-chip instruments, such as test, debug, monitoring, measure- ment and configuration features. Flexible access to embedded instruments allows test time reduction, which is important at production test. However, the test access scheme should be carefully selected such that resource constraints are not violated and power constraints are met. For IEEE P1687, we detail in this paper session-based and session-less test scheduling, and propose resource and power-aware test scheduling algorithms for the detailed scheduling types. Results using the implementation of our algorithms shows on ITC’02-based benchmarks significant test time... (More)
In contrast to IEEE 1149.1, IEEE P1687 allows, through segment insertion bits, flexible scan paths for accessing on-chip instruments, such as test, debug, monitoring, measure- ment and configuration features. Flexible access to embedded instruments allows test time reduction, which is important at production test. However, the test access scheme should be carefully selected such that resource constraints are not violated and power constraints are met. For IEEE P1687, we detail in this paper session-based and session-less test scheduling, and propose resource and power-aware test scheduling algorithms for the detailed scheduling types. Results using the implementation of our algorithms shows on ITC’02-based benchmarks significant test time reductions when compared to non-optimized test schedules. (Less)
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
Test Scheduling, Constraints, IEEE P1687, IJTAG
in
[Host publication title missing]
pages
6 pages
publisher
IEEE--Institute of Electrical and Electronics Engineers Inc.
conference name
Test Symposium (ATS), 2011 20th Asian
external identifiers
  • scopus:84856167314
ISSN
1081-7735
ISBN
978-1-4577-1984-4
DOI
10.1109/ATS.2011.80
language
English
LU publication?
no
id
63d617cc-20f5-4c4e-81d2-e0b7fee7edfa (old id 2734089)
date added to LUP
2012-06-08 14:51:53
date last changed
2017-08-27 04:35:36
@inproceedings{63d617cc-20f5-4c4e-81d2-e0b7fee7edfa,
  abstract     = {In contrast to IEEE 1149.1, IEEE P1687 allows, through segment insertion bits, flexible scan paths for accessing on-chip instruments, such as test, debug, monitoring, measure- ment and configuration features. Flexible access to embedded instruments allows test time reduction, which is important at production test. However, the test access scheme should be carefully selected such that resource constraints are not violated and power constraints are met. For IEEE P1687, we detail in this paper session-based and session-less test scheduling, and propose resource and power-aware test scheduling algorithms for the detailed scheduling types. Results using the implementation of our algorithms shows on ITC’02-based benchmarks significant test time reductions when compared to non-optimized test schedules.},
  author       = {Ghani Zadegan, Farrokh and Ingelsson, Urban and Asani, Golnaz and Carlsson, Gunnar and Larsson, Erik},
  booktitle    = {[Host publication title missing]},
  isbn         = {978-1-4577-1984-4},
  issn         = {1081-7735},
  keyword      = {Test Scheduling,Constraints,IEEE P1687,IJTAG},
  language     = {eng},
  pages        = {525--531},
  publisher    = {IEEE--Institute of Electrical and Electronics Engineers Inc.},
  title        = {Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints},
  url          = {http://dx.doi.org/10.1109/ATS.2011.80},
  year         = {2011},
}