Advanced

Simplifying Nanowire Hall Effect Characterization by Using a Three-Probe Device Design

Hultin, Olof LU ; Otnes, Gaute LU ; Samuelson, Lars LU and Storm, Kristian LU (2017) In Nano Letters 17(2). p.1121-1126
Abstract

Electrical characterization of nanowires is a time-consuming and challenging task due to the complexity of single nanowire device fabrication and the difficulty in interpreting the measurements. We present a method to measure Hall effect in nanowires using a three-probe device that is simpler to fabricate than previous four-probe nanowire Hall devices and allows characterization of nanowires with smaller diameter. Extraction of charge carrier concentration from the three-probe measurements using an analytical model is discussed and compared to simulations. The validity of the method is experimentally verified by a comparison between results obtained with the three-probe method and results obtained using four-probe nanowire Hall... (More)

Electrical characterization of nanowires is a time-consuming and challenging task due to the complexity of single nanowire device fabrication and the difficulty in interpreting the measurements. We present a method to measure Hall effect in nanowires using a three-probe device that is simpler to fabricate than previous four-probe nanowire Hall devices and allows characterization of nanowires with smaller diameter. Extraction of charge carrier concentration from the three-probe measurements using an analytical model is discussed and compared to simulations. The validity of the method is experimentally verified by a comparison between results obtained with the three-probe method and results obtained using four-probe nanowire Hall measurements. In addition, a nanowire with a diameter of only 65 nm is characterized to demonstrate the capabilities of the method. The three-probe Hall effect method offers a relatively fast and simple, yet accurate way to quantify the charge carrier concentration in nanowires and has the potential to become a standard characterization technique for nanowires.

(Less)
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
doping, electrical characterization, Hall effect, Nanowire
in
Nano Letters
volume
17
issue
2
pages
6 pages
publisher
The American Chemical Society
external identifiers
  • scopus:85011965361
  • wos:000393848800073
ISSN
1530-6984
DOI
10.1021/acs.nanolett.6b04723
language
English
LU publication?
yes
id
e3acfefd-b9fc-4274-9dac-28622f794c4f
date added to LUP
2017-02-23 07:30:55
date last changed
2018-01-16 13:24:06
@article{e3acfefd-b9fc-4274-9dac-28622f794c4f,
  abstract     = {<p>Electrical characterization of nanowires is a time-consuming and challenging task due to the complexity of single nanowire device fabrication and the difficulty in interpreting the measurements. We present a method to measure Hall effect in nanowires using a three-probe device that is simpler to fabricate than previous four-probe nanowire Hall devices and allows characterization of nanowires with smaller diameter. Extraction of charge carrier concentration from the three-probe measurements using an analytical model is discussed and compared to simulations. The validity of the method is experimentally verified by a comparison between results obtained with the three-probe method and results obtained using four-probe nanowire Hall measurements. In addition, a nanowire with a diameter of only 65 nm is characterized to demonstrate the capabilities of the method. The three-probe Hall effect method offers a relatively fast and simple, yet accurate way to quantify the charge carrier concentration in nanowires and has the potential to become a standard characterization technique for nanowires.</p>},
  author       = {Hultin, Olof and Otnes, Gaute and Samuelson, Lars and Storm, Kristian},
  issn         = {1530-6984},
  keyword      = {doping,electrical characterization,Hall effect,Nanowire},
  language     = {eng},
  month        = {02},
  number       = {2},
  pages        = {1121--1126},
  publisher    = {The American Chemical Society},
  series       = {Nano Letters},
  title        = {Simplifying Nanowire Hall Effect Characterization by Using a Three-Probe Device Design},
  url          = {http://dx.doi.org/10.1021/acs.nanolett.6b04723},
  volume       = {17},
  year         = {2017},
}