Simplifying Nanowire Hall Effect Characterization by Using a Three-Probe Device Design
(2017) In Nano Letters 17(2). p.1121-1126- Abstract
Electrical characterization of nanowires is a time-consuming and challenging task due to the complexity of single nanowire device fabrication and the difficulty in interpreting the measurements. We present a method to measure Hall effect in nanowires using a three-probe device that is simpler to fabricate than previous four-probe nanowire Hall devices and allows characterization of nanowires with smaller diameter. Extraction of charge carrier concentration from the three-probe measurements using an analytical model is discussed and compared to simulations. The validity of the method is experimentally verified by a comparison between results obtained with the three-probe method and results obtained using four-probe nanowire Hall... (More)
Electrical characterization of nanowires is a time-consuming and challenging task due to the complexity of single nanowire device fabrication and the difficulty in interpreting the measurements. We present a method to measure Hall effect in nanowires using a three-probe device that is simpler to fabricate than previous four-probe nanowire Hall devices and allows characterization of nanowires with smaller diameter. Extraction of charge carrier concentration from the three-probe measurements using an analytical model is discussed and compared to simulations. The validity of the method is experimentally verified by a comparison between results obtained with the three-probe method and results obtained using four-probe nanowire Hall measurements. In addition, a nanowire with a diameter of only 65 nm is characterized to demonstrate the capabilities of the method. The three-probe Hall effect method offers a relatively fast and simple, yet accurate way to quantify the charge carrier concentration in nanowires and has the potential to become a standard characterization technique for nanowires.
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- author
- Hultin, Olof LU ; Otnes, Gaute LU ; Samuelson, Lars LU and Storm, Kristian LU
- organization
- publishing date
- 2017-02-08
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- doping, electrical characterization, Hall effect, Nanowire
- in
- Nano Letters
- volume
- 17
- issue
- 2
- pages
- 6 pages
- publisher
- The American Chemical Society (ACS)
- external identifiers
-
- pmid:28105848
- wos:000393848800073
- scopus:85011965361
- ISSN
- 1530-6984
- DOI
- 10.1021/acs.nanolett.6b04723
- language
- English
- LU publication?
- yes
- id
- e3acfefd-b9fc-4274-9dac-28622f794c4f
- date added to LUP
- 2017-02-23 07:30:55
- date last changed
- 2024-04-14 05:27:53
@article{e3acfefd-b9fc-4274-9dac-28622f794c4f,
abstract = {{<p>Electrical characterization of nanowires is a time-consuming and challenging task due to the complexity of single nanowire device fabrication and the difficulty in interpreting the measurements. We present a method to measure Hall effect in nanowires using a three-probe device that is simpler to fabricate than previous four-probe nanowire Hall devices and allows characterization of nanowires with smaller diameter. Extraction of charge carrier concentration from the three-probe measurements using an analytical model is discussed and compared to simulations. The validity of the method is experimentally verified by a comparison between results obtained with the three-probe method and results obtained using four-probe nanowire Hall measurements. In addition, a nanowire with a diameter of only 65 nm is characterized to demonstrate the capabilities of the method. The three-probe Hall effect method offers a relatively fast and simple, yet accurate way to quantify the charge carrier concentration in nanowires and has the potential to become a standard characterization technique for nanowires.</p>}},
author = {{Hultin, Olof and Otnes, Gaute and Samuelson, Lars and Storm, Kristian}},
issn = {{1530-6984}},
keywords = {{doping; electrical characterization; Hall effect; Nanowire}},
language = {{eng}},
month = {{02}},
number = {{2}},
pages = {{1121--1126}},
publisher = {{The American Chemical Society (ACS)}},
series = {{Nano Letters}},
title = {{Simplifying Nanowire Hall Effect Characterization by Using a Three-Probe Device Design}},
url = {{https://lup.lub.lu.se/search/files/70716608/Three_Probe_Nanowire_Hall_Effect_Measurements_revised.pdf}},
doi = {{10.1021/acs.nanolett.6b04723}},
volume = {{17}},
year = {{2017}},
}