11 – 20 of 26
- show: 10
- |
- sort: year (new to old)
Close
Embed this list
<iframe src=" "
width=" "
height=" "
allowtransparency="true"
frameborder="0">
</iframe>
- 2020
-
Mark
Enabling Image Recognition on Constrained Devices Using Neural Network Pruning and a CycleGAN
2020) First international workshop on Internet of Things for Emergency Management (IoT4Emergency)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2019
-
Mark
IEEE Std. P1687.1: Access to IEEE Std. 1687 via UART
2019) 4th International Test Standards Application Workshop(
- Contribution to conference › Paper, not in proceeding
-
Mark
IEEE Std. P1687.1: translator and protocol
2019) International Test Conference (ITC)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Functional port for accessing on-chip instruments
2019) Nordic Test Forum, 2019(
- Contribution to conference › Paper, not in proceeding
-
Mark
Maintainability of large-scale IoT
2019) DTU High Tech Summit(
- Contribution to conference › Paper, not in proceeding
-
Mark
Test Flow Selection for Stacked Integrated Circuits
(
- Contribution to journal › Article
- 2018
-
Mark
On-Chip Fault Monitoring Using Self-Reconfiguring IEEE 1687 Networks
(
- Contribution to journal › Article
-
Mark
Systemkretsar ställer nya krav på testningen
(
- Contribution to specialist publication or newspaper › Newspaper article
- 2017
-
Mark
Test Planning for Core-based Integrated Circuits under Power Constraints
(
- Contribution to journal › Article
-
Mark
Clustered checkpointing: Maximizing the level of confidence for non-equidistant checkpointing
(
- Contribution to journal › Article