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- 2008
-
Mark
An Integrated System-on-Chip Test Framework
(2008) p.439-454
- Chapter in Book/Report/Conference proceeding › Book chapter
-
Mark
SOC Test Optimization with Compression-Technique Selection
(2008) A Workshop in Conjunction with the International Test Conference
- Contribution to conference › Paper, not in proceeding
- 2007
-
Mark
Protocol Requirements in an SJTAG/IJTAG Environment
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Test Data Truncation for Test Quality Maximization under ATE Memory Depth Constraint
- Contribution to journal › Article
-
Mark
Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
(2007) p.221-244
- Chapter in Book/Report/Conference proceeding › Book chapter
-
Mark
Optimized Integration of Test Compression and Sharing for SOC Testing
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
An Architecture for Combined Test Data Compression and Abort-on-Fail Test
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
What Impacts Course Evaluation?
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Extended STAPL as SJTAG Engine
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
