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2003
Mark Photoelectron escape depth in Bi2Sr2CaCu2O8+x
Zakharov, Alexei ^LU ; Lindau, Ingolf ^LU and Yoshizaki, R (2003) In Physica C: Superconductivity and its Applications 398(1-2). p.49-52
- Contribution to journal › Article
2002
Mark Investigation of polymethylmethacrylate resist residues using photoelectron microscopy
Maximov, Ivan ^LU ; Zakharov, AA ; Holmqvist, Tommy ^LU ; Montelius, Lars ^LU and Lindau, Ingolf ^LU (2002) 20th North American Conference on Molecular Beam Epitaxy 20(3). p.1139-1142
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Scanning photoelectron microscopy study of as-grown and heat-treated chemical vapor deposition boron-doped diamond films
Zakharov, Alexei ^LU ; Ralchenko, V ; Khmelnitskii, R and Lindau, Ingolf ^LU (2002) In Journal of Vacuum Science and Technology B 20(6). p.2509-2513
- Contribution to journal › Article
Mark Quantative photoelectron spectromicroscopy for investigation of PMMA resist residues
Zakharov, Alexei ^LU ; Maximov, Ivan ^LU ; Holmqvist, T. ; Montelius, Lars ^LU and Lindau, Ingolf ^LU (2002) Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Anisotropy of the electronic structure of low-dimensional Sr(Ca)CuO2 single crystals studied by scanning photoelectron spectromicroscopy
Zakharov, Alexei ^LU ; Matsuura, AY ; Lindau, Ingolf ^LU and Leonyuk, L (2002) In Journal of Electron Spectroscopy and Related Phenomena 122(3). p.203-208
- Contribution to journal › Article
Mark Investigation of PMMA resist residues using photoelectron microscopy
Maximov, Ivan ^LU ; Zakharov, Alexei ^LU ; Holmqvist, T. ; Montelius, Lars ^LU and Lindau, Ingolf ^LU (2002) In Journal of Vacuum Science and Technology B20(3). p.1139-1142
- Contribution to journal › Article
Mark Fusk och fysik
Martinsson, Indrek and Lindau, Ingolf ^LU (2002)
- Other contribution › Miscellaneous
Mark Photoelectron spectromicroscopy study of Bi2Sr2CaCu2O8+x single crystal
Berolo, M ; La Rosa, S. ; Goldoni, A. ; Gualtiero, G. ; Zakharov, Alexei ^LU ; Lindau, Ingolf ^LU ; Vobornik, I. and Yoshizaki, R. (2002) In Physical Review B B66. p.060506-060510
- Contribution to journal › Article
2001
Mark Beamline I311 at MAX-LAB : A VUV/soft X-ray undulator beamline for high resolution electron spectroscopy
Nyholm, R. ^LU ; Andersen, J. N. ^LU ; Johansson, Ulf ^LU ; Jensen, B. N. ^LU and Lindau, I. ^LU (2001) In Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment 467-468. p.520-524
- Contribution to journal › Article
1998
Mark O KVV Auger emission versus resonant photoemission at the O K edge of high-Tc superconductors
Nylén, H. ^LU ; Qvarford, M. ; Chiaia, G. ; Tjernberg, O. ; Söderholm, S. ; Zakharov, A. A. ^LU ; Leandersson, M. ^LU ; Nazin, V. G. ; Tsetlin, M. B. and Lev, L. , et al. (1998) In Physica C: Superconductivity and its Applications 300(3-4). p.161-170
- Contribution to journal › Article

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