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- 2024
-
Mark
On Modeling and Detecting Trojans in Instruction Sets
(
- Contribution to journal › Article
- 2023
-
Mark
Secure reuse of DfT during operation
2023) Nordic Test Forum(
- Contribution to conference › Paper, not in proceeding
- 2019
-
Mark
Functional port for accessing on-chip instruments
2019) Nordic Test Forum, 2019(
- Contribution to conference › Paper, not in proceeding
-
Mark
Test Flow Selection for Stacked Integrated Circuits
(
- Contribution to journal › Article
- 2018
-
Mark
On-Chip Fault Monitoring Using Self-Reconfiguring IEEE 1687 Networks
(
- Contribution to journal › Article
-
Mark
Test of Reconfigurable Modules in Scan Networks
(
- Contribution to journal › Article
- 2016
-
Mark
Towards a Suite of IEEE 1687 Benchmark Networks
2016) Test Standards Application Workshop (TESTA)(
- Contribution to conference › Paper, not in proceeding
-
Mark
Retargeting Challenges in IEEE 1687 Networks
2016) Test Standards Application Workshop (TESTA)(
- Contribution to conference › Paper, not in proceeding
-
Mark
Test, Validation and Diagnosis of IEEE 1687 Networks
2016) Test Standards Application Workshop (TESTA)(
- Contribution to conference › Paper, not in proceeding
-
Mark
On the Testability of IEEE 1687 Networks
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding