101 – 110 of 172
- show: 10
- |
- sort: year (new to old)
Close
Embed this list
<iframe src=" "
width=" "
height=" "
allowtransparency="true"
frameborder="0">
</iframe>
- 2009
-
Mark
Generation of Minimal Leakage Input Vectors with Constrained NBTI Degradation
(
- Contribution to conference › Paper, not in proceeding
-
Mark
Deterministic Scan-Chain Diagnosis for Intermittent Faults
2009) European Test Symposium, ETS 2009(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
On Minimization of Peak Power for Scan Circuit during Test
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Fault-tolerant average execution time optimization for general-purpose multi-processor system-on-chips
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Scan Cell Reordering to Minimize Peak Power during Scan Testing of SoC
(
- Contribution to conference › Paper, not in proceeding
-
Mark
An Even-Odd DFD Technique for Scan Chain Diagnosis
2009) Workshop on RTL and High Level Testing (WRTLT)(
- Contribution to conference › Paper, not in proceeding
-
Mark
Fault-Tolerant Average Execution Time Optimization for System-On-Chips
2009) Frontiers of High Performance Embedded Computing(
- Contribution to conference › Paper, not in proceeding
- 2008
-
Mark
An Integrated System-on-Chip Test Framework
2008) p.439-454(
- Chapter in Book/Report/Conference proceeding › Book chapter
-
Mark
Core-Level Expansion of Compressed Test Patterns
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Test-Architecture Optimization and Test Scheduling for SOCs with Core-Level Expansion of Compressed Test Patterns
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding