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- 2009
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Mark
Thermal Aware Test Scheduling for Stacked Multi-Chip-Modules
2009) DATE 2009 Friday Workshop on 3D Integration - Technology, Architecture, Design, Automation, and Tes(
- Contribution to conference › Paper, not in proceeding
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Mark
On Scan Chain Diagnosis for Intermittent Faults
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Capture Power Reduction for Modular System-on-Chip Test
2009) IEEE/VSI VLSI Design and Test Symposium (VDAT)(
- Contribution to conference › Paper, not in proceeding
-
Mark
Deterministic Scan-Chain Diagnosis for Intermittent Faults
2009) European Test Symposium, ETS 2009(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
On Minimization of Peak Power for Scan Circuit during Test
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Fault-tolerant average execution time optimization for general-purpose multi-processor system-on-chips
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
An Even-Odd DFD Technique for Scan Chain Diagnosis
2009) Workshop on RTL and High Level Testing (WRTLT)(
- Contribution to conference › Paper, not in proceeding
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Mark
Scan Cell Reordering to Minimize Peak Power during Scan Testing of SoC
(
- Contribution to conference › Paper, not in proceeding
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Mark
Fault-Tolerant Average Execution Time Optimization for System-On-Chips
2009) Frontiers of High Performance Embedded Computing(
- Contribution to conference › Paper, not in proceeding
- 2008
-
Mark
Core-Level Expansion of Compressed Test Patterns
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding