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2002
Mark Quantative photoelectron spectromicroscopy for investigation of PMMA resist residues
Zakharov, Alexei ^LU ; Maximov, Ivan ^LU ; Holmqvist, T. ; Montelius, Lars ^LU and Lindau, Ingolf ^LU (2002) Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Observation of the molten state of nano-particles with an atomic force microscope
Kortegaard, Carl ^LU ; Deppert, Knut ^LU ; Ismail, S. ; Junno, T. ; Larne, H. ; Magnusson, Martin ^LU ; Thelander, Claes ^LU and Samuelson, Lars ^LU (2002) Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark New high resolution negative resist mr-L 6000.1 XP for electron beam and nanoimprint lithography
Maximov, Ivan ^LU ; Beck, Marc ^LU ; Carlberg, Patrick ^LU ; Montelius, Lars ^LU ; Pfeiffer, K. ; Reuther, F. ; Gruetzer, G. ; Schulz, H. ; Wissen, M. and Scheer, H.-C. (2002) Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Three-terminal ballistic junctions: new building blocks for functional devices in nanoelectronics
Xu, Hongqi ^LU ; Shorubalko, Ivan ^LU ; Maximov, Ivan ^LU ; Seifert, Werner ^LU ; Omling, Pär ^LU and Samuelson, Lars ^LU (2002) Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Nanoimprint in mr-L 6000.1 XP/PMMA resist system
Carlberg, Patrick ^LU ; Beck, Marc ^LU ; Graczyk, Mariusz ^LU ; Maximov, Ivan ^LU ; Sarwe, Eva-Lena ^LU ; Montelius, Lars ^LU ; Pfeiffer, K. ; Reuther, F. and Gruetzner, G. (2002) Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark A resonant tunneling permeable base transistor with Al-free tunneling barriers
Lind, Erik ^LU ; Lindström, Peter ^LU ; Pietzonka, I. ; Seifert, Werner ^LU and Wernersson, Lars-Erik ^LU (2002) Device Research Conference, 2002 p.155-156
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Boundary conditions in the envelope function approximation as applied to semiconductor heterostructures
Pistol, Mats-Erik ^LU (2002) Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Cathodoluminescence for studies of low dimensional semiconductor structures
Gustafsson, Anders ^LU (2002) Microscopy of Semiconducting Materials XII 169. p.547-556
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Electron beam induced luminescence studies of low-dimensional semiconducotor structures
Gustafsson, Anders ^LU and Samuelson, Lars ^LU (2002) 17. p.445-530
- Chapter in Book/Report/Conference proceeding › Book chapter
Mark Electron accumulation in small and larger semiconductor quantum dots
Persson, Jonas ^LU ; Holm, Magnus ^LU ; Hessman, Dan ^LU ; Pistol, Mats-Erik ^LU ; Pryor, C. and Samuelson, Lars ^LU (2002) Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding

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