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2020
Mark Effects of traps in the gate stack on the small-signal RF response of III-V nanowire MOSFETs
Hellenbrand, Markus ^LU ; Lind, Erik ^LU ; Kilpi, Olli-Pekka ^LU and Wernersson, Lars-Erik ^LU (2020) In Solid-State Electronics 171.
- Contribution to journal › Article
2019
Mark Low-Frequency Noise in Nanowire and Planar III-V MOSFETs
Hellenbrand, Markus ^LU ; Kilpi, Olli-Pekka ^LU ; Svensson, Johannes ^LU ; Lind, Erik ^LU and Wernersson, Lars-Erik ^LU (2019) In Microelectronic Engineering
- Contribution to journal › Article