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- 2022
-
Mark
Low-Frequency Noise in Vertical InAs/InGaAs Gate-All-Around MOSFETs at 15 K for Cryogenic Applications
Mamidala, Saketh, Ram LU
; Svensson, Johannes
LU
; Skog, Sebastian
; Johannesson, Sofie
and Wernersson, Lars-Erik
LU
(2022)
In IEEE Electron Device Letters
43(12).
p.2033-2033
- Contribution to journal › Article
- 2015
-
Mark
High Frequency InGaAs Nanowire MOSFETs
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding