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2015
Mark Abort-on-Fail Test Scheduling for Modular SOCs without and with Preemption
Ingelsson, Urban ; Kumar Goel, Sandeep ; Larsson, Erik ^LU and Marinissen, Erik Jan (2015) In IEEE Transactions on Computers 64(12). p.3335-3347
- Contribution to journal › Article
2008
Mark An Integrated System-on-Chip Test Framework
Larsson, Erik ^LU and Peng, Zebo (2008) p.439-454
- Chapter in Book/Report/Conference proceeding › Book chapter
Mark Test-Architecture Optimization and Test Scheduling for SOCs with Core-Level Expansion of Compressed Test Patterns
Larsson, Anders ; Larsson, Erik ^LU ; Chakrabarty, Krishnendu ; Eles, Petru Ion and Peng, Zebo (2008) Design, Automation, and Test in Europe DATE 2008 p.188-193
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Core-Level Expansion of Compressed Test Patterns
Larsson, Anders ; Zhang, Xin ; Larsson, Erik ^LU and Chakrabarty, Krishnendu (2008) 17th Asian Test Symposium ATS p.277-277
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
2007
Mark A Heuristic for Concurrent SOC Test Scheduling with Compression and Sharing
Larsson, Anders ; Larsson, Erik ^LU ; Eles, Petru Ion and Peng, Zebo (2007) IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, 2007 p.61-61
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
Larsson, Erik ^LU and Edbom, Stina (2007) p.221-244
- Chapter in Book/Report/Conference proceeding › Book chapter
Mark Optimized Integration of Test Compression and Sharing for SOC Testing
Larsson, Anders ; Larsson, Erik ^LU ; Eles, Petru Ion and Peng, Zebo (2007) Design, Automation, and Test in Europe Conference DATE07 p.207-207
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
2006
Mark Cycle-Accurate Test Power Modeling and its Application to SoC Test Scheduling
Samii, Soheil ; Larsson, Erik ^LU ; Chakrabarty, Krishnendu and Peng, Zebo (2006) IEEE International Test Conference ITC '06 p.1-32
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
2005
Mark Silent CMOS circuits aiming for system-on-chip
Yuan, Jiren ^LU (2005) 2005 6th International Conference on ASIC Proceedings 1. p.278-281
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Introduction to Advanced System-on-Chip Test Design and Optimization
Larsson, Erik ^LU (2005) In Frontiers in Electronic Testing
- Book/Report › Book

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