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- 2005
-
Mark
Introduction to Advanced System-on-Chip Test Design and Optimization
(2005) In Frontiers in Electronic Testing
- Book/Report › Book
-
Mark
Optimization of a Bus-based Test Data Transportation Mechanism in System-on-Chip
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Test Scheduling for Modular SOCs in an Abort-on-Fail Environment
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
A Test Data Compression Architecture with Abort-on Fail Capability
(2005) IEEE Workshop on RTL and High Level Testing WRTLT
- Contribution to conference › Paper, not in proceeding
-
Mark
Boundary-Scan Test Control in the ATCA Standard
(2005)
- Contribution to conference › Paper, not in proceeding
-
Mark
Remote Boundary-Scan System Test Control for the ATCA Standard
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2004
-
Mark
Integrating Core Selection in the SOC Test Solution Design-Flow
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
An Integrated Technique for Test Vector Selection and Test Scheduling under Test Time Constraint
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Core Selection Integrated in the SOC Test Solution Design-Flow
(2004)
- Other contribution › Miscellaneous
-
Mark
High strain-rate tensile testing and viscoplastic parameter identification using microscopic high-speed photography
- Contribution to journal › Article
