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2017
Mark Test Planning for Core-based Integrated Circuits under Power Constraints
SenGupta, Breeta ^LU ; Nikolov, Dimitar ^LU ; Ingelsson, Urban and Larsson, Erik ^LU (2017) In Journal of Electronic Testing: Theory and Applications 33(1). p.7-23
- Contribution to journal › Article
2013
Mark Embedded DfT Instrumentation: Design, Access, Retargeting and Case Studies
Larsson, Erik ^LU and Keim, Martin (2013) VLSI Test Symposium (VTS)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
2012
Mark Re-using Chip Level DFT at Board Level
Gu, Xinli ; Rearick, Jeff ; Eklow, Bill ; Qian, Jun ; Jutman, Artur ; Chakrabarty, Krishnendu and Larsson, Erik ^LU (2012) European Test Symposium, 2012 p.205-205
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Accessing Embedded DfT Instruments with IEEE P1687
Larsson, Erik ^LU and Ghani Zadegan, Farrokh ^LU (2012) IEEE 21st Asian Test Symposium (ATS) p.71-76
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding