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2008
Mark Test-Architecture Optimization and Test Scheduling for SOCs with Core-Level Expansion of Compressed Test Patterns
Larsson, Anders ; Larsson, Erik ^LU ; Chakrabarty, Krishnendu ; Eles, Petru Ion and Peng, Zebo (2008) Design, Automation, and Test in Europe DATE 2008 p.188-193
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
2007
Mark Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
Larsson, Erik ^LU and Edbom, Stina (2007) p.221-244
- Chapter in Book/Report/Conference proceeding › Book chapter
2005
Mark Multiple Constraints Driven System-on-Chip Test Time Optimization
Pouget, Julien ; Larsson, Erik ^LU and Peng, Zebo (2005) In Journal of Electronic Testing 21(6). p.599-611
- Contribution to journal › Article
Mark Introduction to Advanced System-on-Chip Test Design and Optimization
Larsson, Erik ^LU (2005) In Frontiers in Electronic Testing
- Book/Report › Book
Mark Optimization of a Bus-based Test Data Transportation Mechanism in System-on-Chip
Larsson, Anders ; Larsson, Erik ^LU ; Eles, Petru Ion and Peng, Zebo (2005) 8th Euromicro Conference on Digital System Design DSD 2005 p.403-409
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
2004
Mark Integrating Core Selection in the SOC Test Solution Design-Flow
Larsson, Erik ^LU (2004) International Test conference ITC04 p.1349-1358
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
2003
Mark Test Resource Partitioning and Optimization for SOC Designs
Larsson, Erik ^LU and Fujiwara, Hideo (2003) 2003 IEEE VLSI Test Symposium VTS03 p.319-319
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark An Efficient Approach to SoC Wrapper Design, TAM Configuration and Test Scheduling
Pouget, Julien ; Larsson, Erik ^LU ; Peng, Zebo ; Flottes, Marie-Lise and Rouzeyre, Bruno (2003) IEEE European Test Workshop 2003 ETW03 p.51-56
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
2002
Mark Integrated Test Scheduling, Test Parallelization and TAM Design
Larsson, Erik ^LU ; Arvidsson, Klas ; Fujiwara, Hideo and Peng, Zebo (2002) IEEE Asian Test Symposium ATS02 p.397-404
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Power Constrained Preemptive TAM Scheduling
Larsson, Erik ^LU and Fujiwara, Hideo (2002) 7th IEEE European Test Workshop,2002 p.119-119
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding

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