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- 2005
-
Mark
Abort-on-Fail Based Test Scheduling
(
- Contribution to journal › Article
-
Mark
SOC Test Scheduling with Test Set Sharing and Broadcasting
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
2005) IFIP WG 10.5 Conference on Very Large Scale Integration System-on-Chip {IFIP VLSI-SOC 2005} p.429-434(
- Contribution to conference › Paper, not in proceeding
- 2004
-
Mark
Defect-Aware SOC Test Scheduling
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Integrating Core Selection in the SOC Test Solution Design-Flow
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Efficient test solutions for core-based designs
2004) In IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 23(5). p.758-775(
- Contribution to journal › Article
-
Mark
Preemptive system-on-chip test scheduling
(
- Contribution to journal › Article
- 2003
-
Mark
Buffer and Controller Minimization for Time-Constrained Testing of System-On-Chip
2003) 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems DFT03 p.385-392(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Test Resource Partitioning and Optimization for SOC Designs
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
SOC Test Time Minimization Under Multiple Constraints
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding