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- 2008
-
Mark
SOC Test Optimization with Compression-Technique Selection
2008) A Workshop in Conjunction with the International Test Conference(
- Contribution to conference › Paper, not in proceeding
-
Mark
On Reduction of Capture Power for Modular System-on-Chip Test
2008) IEEE Workshop on RTL and High Level Testing WRTLT08(
- Contribution to conference › Paper, not in proceeding
- 2007
-
Mark
Protocol Requirements in an SJTAG/IJTAG Environment
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Test Data Truncation for Test Quality Maximization under ATE Memory Depth Constraint
(
- Contribution to journal › Article
-
Mark
Extended STAPL as SJTAG Engine
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
An Architecture for Combined Test Data Compression and Abort-on-Fail Test
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Optimized Integration of Test Compression and Sharing for SOC Testing
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
2007) p.221-244(
- Chapter in Book/Report/Conference proceeding › Book chapter
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Mark
Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
A Heuristic for Concurrent SOC Test Scheduling with Compression and Sharing
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding