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- 2019
- Synchrotron X-ray based characterization of technologically relevant III-V surfaces and nanostructures
- Semiconductor Nanowires: Characterization and surface modification
- Scanning probe techniques as an investigation tool for semiconductor nanostructures and devices
- 2017
- Development of new characterization techniques for III-V nanowire devices
- Atomic Scale Characterization of III-V Nanowire Surfaces