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- 2024
-
Mark
Interface Modification and Characterization of Nanostructured Semiconductors : A Bridge to Contemporary Electronics
(2024)
- Thesis › Doctoral thesis (compilation)
- 2023
-
Mark
Adventures of III-V Semiconductor Surfaces
(2023)
- Thesis › Doctoral thesis (compilation)
- 2022
-
Mark
Surface modification of III-V nanostructures studied by low-temperature scanning tunneling microscopy
(2022)
- Thesis › Doctoral thesis (compilation)
-
Mark
Reaction Mechanisms and Dynamics in the Early Stage of High-κ Oxide Atomic Layer Deposition : Investigations by In Situ and Operando X-ray Photoemission Spectroscopy
(2022)
- Thesis › Doctoral thesis (compilation)
-
Mark
Surfaces and interfaces of low dimensional III-V semiconductor devices
(2022)
- Thesis › Doctoral thesis (compilation)
- 2019
-
Mark
Synchrotron X-ray based characterization of technologically relevant III-V surfaces and nanostructures
(2019)
- Thesis › Doctoral thesis (monograph)
-
Mark
Semiconductor Nanowires: Characterization and surface modification
(2019)
- Thesis › Doctoral thesis (compilation)
-
Mark
Scanning probe techniques as an investigation tool for semiconductor nanostructures and devices
(2019)
- Thesis › Doctoral thesis (compilation)
- 2017
-
Mark
Development of new characterization techniques for III-V nanowire devices
(2017)
- Thesis › Doctoral thesis (compilation)
-
Mark
Atomic Scale Characterization of III-V Nanowire Surfaces
(2017)
- Thesis › Doctoral thesis (compilation)