Sebastian Kalbfleisch
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- 2024
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Mark
Measuring residual stresses in individual on-chip interconnects using synchrotron nanodiffraction
(
- Contribution to journal › Article
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Mark
In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy
(
- Contribution to journal › Article
- 2023
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Mark
Current capabilities of the imaging endstation at the NanoMAX beamline
2023) 15th International Conference on X-ray Microscopy, XRM 2022(
- Contribution to conference › Paper, not in proceeding
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Mark
Structure of cellulose in birch phloem fibres in tension wood : an X-ray nanodiffraction study
(
- Contribution to journal › Article
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Mark
Decomposition pathways in nano-lamellar CVD Ti0.2Al0.8N
(
- Contribution to journal › Article