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- 2020
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Mark
Soft X-ray diffraction patterns measured by a LiF detector with sub-micrometre resolution and an ultimate dynamic range
(
- Contribution to journal › Article
- 2018
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Mark
Structural Changes in a Single GaN Nanowire under Applied Voltage Bias
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- Contribution to journal › Article
- 2017
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Mark
X-ray Bragg Ptychography on a Single InGaN/GaN Core-Shell Nanowire
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- Contribution to journal › Article
- 2015
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Mark
Strain mapping in an InGaN/GaN nanowire using a nano-focused x-ray beam
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- Contribution to journal › Article
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Mark
Nanofocused x-ray beams applied for mapping strain in core-shell nanowires
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding