Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints
(2011) Test Symposium (ATS), 2011 20th Asian p.525-531- Abstract
- In contrast to IEEE 1149.1, IEEE P1687 allows, through segment insertion bits, flexible scan paths for accessing on-chip instruments, such as test, debug, monitoring, measure- ment and configuration features. Flexible access to embedded instruments allows test time reduction, which is important at production test. However, the test access scheme should be carefully selected such that resource constraints are not violated and power constraints are met. For IEEE P1687, we detail in this paper session-based and session-less test scheduling, and propose resource and power-aware test scheduling algorithms for the detailed scheduling types. Results using the implementation of our algorithms shows on ITC’02-based benchmarks significant test time... (More)
- In contrast to IEEE 1149.1, IEEE P1687 allows, through segment insertion bits, flexible scan paths for accessing on-chip instruments, such as test, debug, monitoring, measure- ment and configuration features. Flexible access to embedded instruments allows test time reduction, which is important at production test. However, the test access scheme should be carefully selected such that resource constraints are not violated and power constraints are met. For IEEE P1687, we detail in this paper session-based and session-less test scheduling, and propose resource and power-aware test scheduling algorithms for the detailed scheduling types. Results using the implementation of our algorithms shows on ITC’02-based benchmarks significant test time reductions when compared to non-optimized test schedules. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2734089
- author
- Ghani Zadegan, Farrokh LU ; Ingelsson, Urban ; Asani, Golnaz ; Carlsson, Gunnar and Larsson, Erik LU
- organization
- publishing date
- 2011
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- keywords
- Test Scheduling, Constraints, IEEE P1687, IJTAG
- host publication
- 2011 Asian Test Symposium
- pages
- 6 pages
- publisher
- IEEE - Institute of Electrical and Electronics Engineers Inc.
- conference name
- Test Symposium (ATS), 2011 20th Asian
- conference location
- New Delhi, India
- conference dates
- 2011-11-20
- external identifiers
-
- scopus:84856167314
- ISSN
- 1081-7735
- ISBN
- 978-1-4577-1984-4
- DOI
- 10.1109/ATS.2011.80
- language
- English
- LU publication?
- no
- id
- 63d617cc-20f5-4c4e-81d2-e0b7fee7edfa (old id 2734089)
- date added to LUP
- 2016-04-01 13:17:08
- date last changed
- 2022-03-21 17:44:56
@inproceedings{63d617cc-20f5-4c4e-81d2-e0b7fee7edfa, abstract = {{In contrast to IEEE 1149.1, IEEE P1687 allows, through segment insertion bits, flexible scan paths for accessing on-chip instruments, such as test, debug, monitoring, measure- ment and configuration features. Flexible access to embedded instruments allows test time reduction, which is important at production test. However, the test access scheme should be carefully selected such that resource constraints are not violated and power constraints are met. For IEEE P1687, we detail in this paper session-based and session-less test scheduling, and propose resource and power-aware test scheduling algorithms for the detailed scheduling types. Results using the implementation of our algorithms shows on ITC’02-based benchmarks significant test time reductions when compared to non-optimized test schedules.}}, author = {{Ghani Zadegan, Farrokh and Ingelsson, Urban and Asani, Golnaz and Carlsson, Gunnar and Larsson, Erik}}, booktitle = {{2011 Asian Test Symposium}}, isbn = {{978-1-4577-1984-4}}, issn = {{1081-7735}}, keywords = {{Test Scheduling; Constraints; IEEE P1687; IJTAG}}, language = {{eng}}, pages = {{525--531}}, publisher = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}}, title = {{Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints}}, url = {{https://lup.lub.lu.se/search/files/3277505/2734111.pdf}}, doi = {{10.1109/ATS.2011.80}}, year = {{2011}}, }