Ptychographic characterization of a coherent nanofocused X-ray beam
(2020) In Optics Express 28(4). p.5069-5076- Abstract
The NanoMAX hard X-ray nanoprobe is the first beamline to take full advantage of the diffraction-limited storage ring at the MAX IV synchrotron and delivers a high coherent photon flux for applications in diffraction and imaging. Here, we characterize its coherent and focused beam using ptychographic analysis. We derive beam profiles in the energy range 6-22 keV and estimate the coherent flux based on a probe mode decomposition approach.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/4f6b845d-3b31-433b-827f-754e9506d880
- author
- Björling, Alexander
LU
; Kalbfleisch, Sebastian
LU
; Kahnt, Maik
LU
; Sala, Simone LU ; Parfeniukas, Karolis ; Vogt, Ulrich ; Carbone, Gerardina LU and Johansson, Ulf LU
- organization
- publishing date
- 2020-02-17
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Optics Express
- volume
- 28
- issue
- 4
- pages
- 8 pages
- publisher
- Optical Society of America
- external identifiers
-
- scopus:85079351442
- pmid:32121735
- ISSN
- 1094-4087
- DOI
- 10.1364/OE.386068
- language
- English
- LU publication?
- yes
- id
- 4f6b845d-3b31-433b-827f-754e9506d880
- date added to LUP
- 2020-02-24 10:35:08
- date last changed
- 2024-09-04 17:36:40
@article{4f6b845d-3b31-433b-827f-754e9506d880, abstract = {{<p>The NanoMAX hard X-ray nanoprobe is the first beamline to take full advantage of the diffraction-limited storage ring at the MAX IV synchrotron and delivers a high coherent photon flux for applications in diffraction and imaging. Here, we characterize its coherent and focused beam using ptychographic analysis. We derive beam profiles in the energy range 6-22 keV and estimate the coherent flux based on a probe mode decomposition approach.</p>}}, author = {{Björling, Alexander and Kalbfleisch, Sebastian and Kahnt, Maik and Sala, Simone and Parfeniukas, Karolis and Vogt, Ulrich and Carbone, Gerardina and Johansson, Ulf}}, issn = {{1094-4087}}, language = {{eng}}, month = {{02}}, number = {{4}}, pages = {{5069--5076}}, publisher = {{Optical Society of America}}, series = {{Optics Express}}, title = {{Ptychographic characterization of a coherent nanofocused X-ray beam}}, url = {{http://dx.doi.org/10.1364/OE.386068}}, doi = {{10.1364/OE.386068}}, volume = {{28}}, year = {{2020}}, }