Abinaya Krishnaraja (Former)
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- 2018
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Mark
RF Characterisation of Vertical III-V Nanowire Tunnel FETs
(2018) Swedish Microwave Days 2018
- Contribution to conference › Paper, not in proceeding
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Mark
Effect of Gate Oxide Defects on Tunnel Transistor RF Performance
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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