Serguei Peredkov (Former)

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<iframe src="https://lup.lub.lu.se/search/person/344a1040-b2a7-4b79-a909-77d209730334?embed=1&amp;hide_pagination=1&amp;hide_info=1&amp;hide_options=1"
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2008
Mark Absolute core-level binding energy shifts between atom and solid : The Born-Haber cycle revisited for free nanoscale metal clusters
Tchaplyguine, Maxim ^LU ; Peredkov, S. ^LU ; Rosso, Aldana ^LU ; Bradeanu, I. ; Öhrwall, Gunnar ^LU ; Legendre, Sébastien ^LU ; Ristinmaa Sörensen, Stacey ^LU ; Mårtensson, Nils ^LU ; Svensson, S. ^LU and Björneholm, O. ^LU (2008) In Journal of Electron Spectroscopy and Related Phenomena 166-167(1-3 C). p.38-44
- Contribution to journal › Article
2005
Mark Planar parabolic X-ray refractive lens made of glassy carbon
Artemiev, AN ; Snigirev, A ; Kohn, V ; Snigireva, I ; Artemiev, N ; Grigoriev, M ; Peredkov, Serguei ^LU ; Glikin, L ; Levtonov, M and Kvardakov, V , et al. (2005) In Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment 543(1). p.322-325
- Contribution to journal › Article
2004
Mark Focusing of hard synchrotron radiation by a refracting glassy carbon lens
Artemiev, AN ; Snigirev, AA ; Kohn, VG ; Snigireva, II ; Artemiev, NA ; Peredkov, Serguei ^LU ; Zabelin, AV and Maevskii, AG (2004) In Crystallography Reports 49. p.166-169
- Contribution to journal › Article
Mark Ray-tracing analysis of diffractive-refractive X-ray optics
Artemiev, N ; Hrdy, J ; Peredkov, Serguei ^LU and Artemev, A (2004) In Journal of Synchrotron Radiation 11. p.157-162
- Contribution to journal › Article
2002
Mark Concept, construction and commissioning of an alignment system for deep X-ray lithography
Wilhelmi, O ; Peredkov, Serguei ^LU and Bogdanov, Alexei ^LU (2002) In Microelectronic Engineering 61-2. p.1107-1112
- Contribution to journal › Article