Erik Larsson

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2005
Mark Multiple Constraints Driven System-on-Chip Test Time Optimization
Pouget, Julien ; Larsson, Erik ^LU and Peng, Zebo (2005) In Journal of Electronic Testing 21(6). p.599-611
- Contribution to journal › Article
Mark Remote Boundary-Scan System Test Control for the ATCA Standard
Bäckström, David ; Carlsson, Gunnar and Larsson, Erik ^LU (2005) International Test Conference ITC05 p.2-32
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Introduction to Advanced System-on-Chip Test Design and Optimization
Larsson, Erik ^LU (2005) In Frontiers in Electronic Testing
- Book/Report › Book
Mark Optimization of a Bus-based Test Data Transportation Mechanism in System-on-Chip
Larsson, Anders ; Larsson, Erik ^LU ; Eles, Petru Ion and Peng, Zebo (2005) 8th Euromicro Conference on Digital System Design DSD 2005 p.403-409
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Test Scheduling for Modular SOCs in an Abort-on-Fail Environment
Ingelsson, Urban ; Goel, Sandeep Kumar ; Larsson, Erik ^LU and Marinissen, Erik Jan (2005) IEEE European Test Symposium ETS 05, 2005 p.8-13
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark SOC Test Scheduling with Test Set Sharing and Broadcasting
Larsson, Anders ; Larsson, Erik ^LU ; Eles, Petru Ion and Peng, Zebo (2005) IEEE Asian Test Symposium p.162-162
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark A Test Data Compression Architecture with Abort-on Fail Capability
Larsson, Erik ^LU and Gilani, Irtiyaz (2005) IEEE Workshop on RTL and High Level Testing WRTLT
- Contribution to conference › Paper, not in proceeding
Mark Emerging strategies for resource-constrained testing of system chips
Peng, Zebo ; Larsson, Erik ^LU and Eles, Petru Ion (2005)
- Other contribution › Miscellaneous
Mark Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
Larsson, Erik ^LU and Edbom, Stina (2005) IFIP WG 10.5 Conference on Very Large Scale Integration System-on-Chip {IFIP VLSI-SOC 2005} p.429-434
- Contribution to conference › Paper, not in proceeding
Mark Boundary-Scan Test Control in the ATCA Standard
Bäckström, David ; Carlsson, Gunnar and Larsson, Erik ^LU (2005)
- Contribution to conference › Paper, not in proceeding