Erik Larsson
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- 2018
-
Mark
Test of Reconfigurable Modules in Scan Networks
Cantoro, Riccardo ; Ghani Zadegan, Farrokh LU ; Palena, Marco ; Pasini, Paolo ; Larsson, Erik LU
and Sonza Reorda, Matteo
(2018)
In IEEE Transactions on Computers
67(12).
p.1806-1817
- Contribution to journal › Article
- 2017
-
Mark
Test Planning for Core-based Integrated Circuits under Power Constraints
SenGupta, Breeta LU ; Nikolov, Dimitar LU ; Ingelsson, Urban and Larsson, Erik LU
(2017)
In Journal of Electronic Testing: Theory and Applications
33(1).
p.7-23
- Contribution to journal › Article
-
Mark
Clustered checkpointing: Maximizing the level of confidence for non-equidistant checkpointing
- Contribution to journal › Article
-
Mark
BASTION: Board and SoC test instrumentation for ageing and no failure found
Jutman, Artur ; Lotz, Christophe ; Larsson, Erik LU
; Sonza Reorda, Matteo
; Jenihhin, Maksim
; Raik, Jaan
; Kerkhoff, Hans
; Krenz-Baath, Rene
and Engelke, Piet
(2017)
In Proceedings (Design, Automation, and Test in Europe Conference and Exhibition. Online)
p.115-120
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Fault Extraction in Self-Reconfiguring IEEE 1687 Networks
Ghani Zadegan, Farrokh LU ; Nikolov, Dimitar LU and Larsson, Erik LU
(2017)
2nd Test Standards Application Workshop
- Contribution to conference › Paper, not in proceeding
-
Mark
Reducing Pessimism in Upper-Bound Computation for Optimal IEEE 1687 Retargeting
Ghani Zadegan, Farrokh LU ; Krenz-Baath, Rene and Larsson, Erik LU
(2017)
2nd Test Standards Application Workshop
- Contribution to conference › Paper, not in proceeding
- 2016
-
Mark
Optimizing the Level of Confidence for Multiple Jobs
- Contribution to journal › Article
-
Mark
On the diagnostic analysis of IEEE 1687 networks
Cantoro, R. ; Montazeri, M. ; Reorda, M. Sonza ; Zadegan, F. Ghani LU and Larsson, E. LU
(2016)
21st IEEE European Test Symposium, ETS 2016
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Compressor design for silicon debug
Zhang, Jing ; Fritz, Lars Johan ; Liu, Liang LU
and Larsson, Erik
LU
(2016)
21st IEEE European Test Symposium, ETS 2016
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Automatic generation of stimuli for fault diagnosis in IEEE 1687 networks
Cantoro, R. ; Montazeri, M. ; Sonza, M. ; Ghani Zadegan, F. LU and Larsson, Erik LU
(2016)
22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016
p.167-172
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding