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- 2024
-
Mark
On Modeling and Detecting Trojans in Instruction Sets
(
- Contribution to journal › Article
-
Mark
Embedded Tutorial: Access to On-chip Instruments via Functional Ports
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2023
-
Mark
Co-optimization of security and accessibility to on-chip instruments
2023) 24th IEEE Latin-American Test Symposium, LATS 2023(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Secure reuse of DfT during operation
2023) Nordic Test Forum(
- Contribution to conference › Paper, not in proceeding
- 2022
-
Mark
Reusing IEEE 1687-Compatible Instruments and Sub-Networks over a System Bus
2022) p.219-228(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Graceful degradation to prolong lifetime of semiconductors
2022) Knowledge for Sustainable Development(
– Lund University Research Conference- Contribution to conference › Poster
- 2021
-
Mark
System-Level Access to On-Chip Instruments
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Graceful Degradation of Reconfigurable Scan Networks
(
- Contribution to journal › Scientific review
-
Mark
Access to on-chip test structures via functional buses
2021) Nordic Test Forum(
- Contribution to conference › Other
-
Mark
Accessing general IEEE Std. 1687 networks via functional ports
2021) p.354-363(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2020
-
Mark
INTERNET OF THINGS AS A COMPLEMENT TO INCREASE SAFETY
(
- Contribution to journal › Article
-
Mark
Enabling Image Recognition on Constrained Devices Using Neural Network Pruning and a CycleGAN
2020) First international workshop on Internet of Things for Emergency Management (IoT4Emergency)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
IEEE Std. P1687.1 for Access Control of Reconfigurable Scan Networks
2020) 25th IEEE European Test Symposium (ETS), 2020(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2019
-
Mark
Functional port for accessing on-chip instruments
2019) Nordic Test Forum, 2019(
- Contribution to conference › Paper, not in proceeding
-
Mark
Maintainability of large-scale IoT
2019) DTU High Tech Summit(
- Contribution to conference › Paper, not in proceeding
-
Mark
Test Flow Selection for Stacked Integrated Circuits
(
- Contribution to journal › Article
-
Mark
IEEE Std. P1687.1: translator and protocol
2019) International Test Conference (ITC)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
IEEE Std. P1687.1: Access to IEEE Std. 1687 via UART
2019) 4th International Test Standards Application Workshop(
- Contribution to conference › Paper, not in proceeding
- 2018
-
Mark
Systemkretsar ställer nya krav på testningen
(
- Contribution to specialist publication or newspaper › Newspaper article
-
Mark
Test of Reconfigurable Modules in Scan Networks
(
- Contribution to journal › Article
-
Mark
On-Chip Fault Monitoring Using Self-Reconfiguring IEEE 1687 Networks
(
- Contribution to journal › Article
- 2017
-
Mark
Clustered checkpointing: Maximizing the level of confidence for non-equidistant checkpointing
(
- Contribution to journal › Article
-
Mark
Test Planning for Core-based Integrated Circuits under Power Constraints
(
- Contribution to journal › Article
-
Mark
BASTION: Board and SoC test instrumentation for ageing and no failure found
2017) In Proceedings (Design, Automation, and Test in Europe Conference and Exhibition. Online) p.115-120(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Fault Extraction in Self-Reconfiguring IEEE 1687 Networks
2017) 2nd Test Standards Application Workshop(
- Contribution to conference › Paper, not in proceeding
-
Mark
Reducing Pessimism in Upper-Bound Computation for Optimal IEEE 1687 Retargeting
2017) 2nd Test Standards Application Workshop(
- Contribution to conference › Paper, not in proceeding
- 2016
-
Mark
Optimizing the Level of Confidence for Multiple Jobs
2016) In IEEE Transactions on Computers(
- Contribution to journal › Article
-
Mark
On the Testability of IEEE 1687 Networks
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Towards a Suite of IEEE 1687 Benchmark Networks
2016) Test Standards Application Workshop (TESTA)(
- Contribution to conference › Paper, not in proceeding
-
Mark
Retargeting Challenges in IEEE 1687 Networks
2016) Test Standards Application Workshop (TESTA)(
- Contribution to conference › Paper, not in proceeding
-
Mark
Test, Validation and Diagnosis of IEEE 1687 Networks
2016) Test Standards Application Workshop (TESTA)(
- Contribution to conference › Paper, not in proceeding
-
Mark
In-Field System-Health Monitoring Based on IEEE 1687
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Automatic generation of stimuli for fault diagnosis in IEEE 1687 networks
2016) 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016 p.167-172(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
On the diagnostic analysis of IEEE 1687 networks
2016) 21st IEEE European Test Symposium, ETS 2016(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Compressor design for silicon debug
2016) 21st IEEE European Test Symposium, ETS 2016(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
A Self-Reconfiguring IEEE 1687 Network for Fault Monitoring
2016) European Test Symposium (ETS), 2016(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Maximizing Level of Confidence for Non-Equidistant Checkpointing
2016) 21st Asia and South Pacific Design Automation Conference ASP-DAC(
- Contribution to conference › Paper, not in proceeding
-
Mark
Accessing On-chip Instruments Through the Life-time of Systems
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Upper-bound computation for optimal retargeting in IEEE1687 networks
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Maximizing level of confidence for non-equidistant Checkpointing
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2015
-
Mark
Abort-on-Fail Test Scheduling for Modular SOCs without and with Preemption
(
- Contribution to journal › Article
-
Mark
Access Time Minimization in IEEE 1687 Networks
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
No Fault Found: The Root Cause
2015) IEEE VLSI Test Symposium(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2014
-
Mark
Design, Verification and Application of IEEE 1687
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Evaluation of Level of Confidence and Optimization of Roll-back Recovery with Checkpointing for Real-Time Systems
(
- Contribution to journal › Article
-
Mark
Test Planning and Test Access Mechanism Design for Stacked Chips using ILP
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Test Planning and Test Access Mechanism Design for 3D SICs
2014) Swedish System on Chip Conference (SSoCC), 2014(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Fault injection and fault handling: an MPSoC demonstrator using IEEE P1687
2014) 20th IEEE International On-Line Testing Symposium(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Robustness of TAP-based Scan Networks
2014) IEEE International Test Conference, 2014(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2013
-
Mark
Embedded DfT Instrumentation: Design, Access, Retargeting and Case Studies
2013) VLSI Test Symposium (VTS)(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding