Integrated Electronic Systems
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- 2026
-
Mark
Spur Analysis and Linearity Enhancement in Fractional-N Phase Locked Loops Through Parallel Sigma–Delta Modulators With Time Offsets
Holmstedt, Johan LU and Sjöland, Henrik LU
(2026)
In IEEE Open Journal of Circuits and Systems
7.
p.21-32
- Contribution to journal › Article
-
Mark
Attacks exploiting on-chip Instruments and IJTAG protection
Åhlund, Joel LU ; Lundberg, Fanny ; Törmänen, Markus LU
and Larsson, Erik
LU
(2026)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Embedded tutorial : security in reconfigurable scan networks
Åhlund, Joel LU ; Törmänen, Markus LU
and Larsson, Erik
LU
(2026)
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Securing reconfigurable scan networks
- Contribution to conference › Paper, not in proceeding
-
Mark
On the importance of time constants in spiking neural networks
Brandt, Filippa LU ; Bastani, Saeed ; Hunt, Alexander ; Aminifar, Amir LU
and Behmanesh, Baktash
LU
(2026)
p.193-198
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Multi-user XR offloading via massive MIMO : a system-level analysis using a real-life dataset
Bárány, Love LU ; Yaman, Ilayda LU ; Edfors, Ove LU
; Aminifar, Amir
LU
and Liu, Liang
LU
(2026)
- Working paper/Preprint › Preprint in preprint archive
-
Mark
Threats and protection of on-chip test features throughout the lifetime of Integrated Circuits
(2026) In Series of licentiate and doctoral theses
- Thesis › Licentiate thesis
- 2025
-
Mark
Large Language Models for Printed Circuit Board Test Generation
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Securing reconfigurable scan networks against data sniffing and data alteration attacks
Åhlund, Joel LU ; Törmänen, Markus LU
; Svensson, Pamela
; Kerttu, Mikael
; Månefjord, Torbjörn
; Johansson, Christian
and Larsson, Erik
LU
(2025)
30th IEEE European Test Symposium
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Secure and efficient sharing of on-chip resources
Åhlund, Joel LU ; Törmänen, Markus LU
and Larsson, Erik
LU
(2025)
2025 IEEE International Test Conference (ITC)
p.474-477
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding