Erik Larsson
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- 2011
-
Mark
SoC-Level Fault Management based on P1687 IJTAG
Carlsson, Gunnar ; Jutman, Artur and Larsson, Erik LU
(2011)
- Other contribution › Miscellaneous
-
Mark
Study on the Level of Confidence for Roll-back Recovery with Checkpointing
Nikolov, Dimitar LU ; Ingelsson, Urban ; Singh, Virendra and Larsson, Erik LU
(2011)
1st Intl. Workshop on Dependability Issues in Deep-submicron Technologies (DDT 2011)
- Contribution to conference › Paper, not in proceeding
-
Mark
A Study of Instrument Reuse and Retargeting in P1687
Ghani Zadegan, Farrokh LU ; Ingelsson, Urban ; Carlsson, Gunnar and Larsson, Erik LU
(2011)
IEEE Twelfth Workshop on RTL and High Level Testing (WRTLT 2011)
- Contribution to conference › Paper, not in proceeding
-
Mark
Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints
Ghani Zadegan, Farrokh LU ; Ingelsson, Urban ; Asani, Golnaz ; Carlsson, Gunnar and Larsson, Erik LU
(2011)
Test Symposium (ATS), 2011 20th Asian
p.525-531
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
European Test Symposium (ETS) 2011
- Contribution to specialist publication or newspaper › Specialist publication article
-
Mark
Adaptive Execution Assistance for Multiplexed Fault-Tolerant Chip Multiprocessors
Subramanyan, Pramod ; Singh, Virendra ; Saluja, Kewal and Larsson, Erik LU
(2011)
Computer Design (ICCD), 2011 IEEE 29th International Conference on
p.419-426
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Test Scheduling and Test Access Optimization for Core-Based 3D Stacked ICs with Through-Silicon Vias: poster
Sengupta, Breeta LU ; Ingelsson, Urban and Larsson, Erik LU
(2011)
IEEE European Test Symposium (ETS), 2011
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2010
-
Mark
A Distributed Architecture to Check Global Properties for Post-Silicon Debug
Larsson, Erik LU
; Vermeulen, Bart
and Goossens, Kees
(2010)
IEEE European Test Symposium (ETS'10), 2010
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Optimizing Fault Tolerance for Multi-Processor System-on-Chip
Nikolov, Dimitar LU ; Väyrynen, Mikael ; Ingelsson, Urban ; Larsson, Erik LU
and Singh, Virendra
(2010)
- Chapter in Book/Report/Conference proceeding › Book chapter
-
Mark
Study on Combined Test-Data Compression and Test Planning for Testing of Modular SoCs
- Chapter in Book/Report/Conference proceeding › Book chapter